TECHCON 2010 Best in Session Awards

Seventeen students received Best in Session Awards at TECHCON 2010, presented by Dr. Michael Mayberry, Intel, SRC Board of Directors Member (second row center)

Paper presentations were judged within sessions with a Best in Session Award made in each session. Representatives from member companies served as judges, using a standard set of criteria and considering both paper presentation and poster.  Sessions included papers from FCRP, GRC, and NRI students with 15 GRC, 1 FCRP, and 1 NRI students winning Best in Session Awards.  The following papers were judged Best in Session:

(titles were taken from the origninal abstract submission.)

Session 1 - Test and Testability
1.6 GRC XiaoXiao Wang
Univ. of Connecticut
Low-Cost On-Chip Structures for Measuring NBTI Effects, Variations, Path Delay, and Noise
Abstract / Presentation
Session 2 - Analog I/O and mm-Wave Circuit Design
2.5 GRC Shuqing (Victor) Cao
Stanford University
ESD and High-Speed I/O Driver Characterization and Co-Design Methodology
Abstract / Presentation
Session 3 - Nanoengineered Materials
3.9 GRC Masahiro Hori
niversity Waseda University
Improving Single Dopant Detection Efficiency by Controlling Substrate Bias in Single Ion Implantation Method
Abstract / Presentation
Session 4 - Memory and Analog Technologies
4.6 GRC Taehun Lee
Univ. of Texas/Dallas
High Thermal Conductivity SOI Substrates for Mixed-Signal Application
Abstract / Presentation
Session 5 - Verification
5.5 GRC Bryan A. Brady
Univ. of California/Berkeley
Low-Power Verification with Term-Level Abstraction
Abstract / Presentation
Session 6 - Multi-Core and Parallel System Design
6.7 GRC Karthik Ganesan
Univ. of Texas/Austin
System-level Max Power (SYMPO) - A Systematic Approach for Escalating System-Level Power Consumption using Synthetic Benchmarks
Abstract / Presentation
Session 7 - Cu/Low k Extendability
7.7 GRC K.J. Ganesh
Univ. of Texas/Austin
Automated Local Texture and Stress Analysis in Cu Interconnects using D-STEM and Precession Microscopy
Abstract / Presentation
Session 8 - Patterning Materials and Systems
8.3 GRC Marie Krysak
Cornell University
PAG and Base-Attached Molecular Glass Resists for Improved Lithographic Performance
Abstract / Presentation
Session 9 - Environment, Safety, and Health
9.3 GRC Jeffrey Rottman
Intel Foundation/SRCEA Fellow
Univ. of Arizona
Fate of CMP Nanoparticles in Municipal Wastewater Treatment
Abstract / Presentation
Session 10 - Digital Circuits and Systems Design (10A) and 3D Design Techniques and Tools (10B)
10.6 GRC Tao Zhang
Pennsylvania State University
A 5-layer 3D Stacked Chip Prototyping for H.264 Application
Abstract / Presentation
Session 11 - Packaging
11.3 GRC Yiwei Wang
Univ. of Texas/Austin
The Impact of Cu Pillar Bumps on the Thermomechanical Reliability and Chip-Package Interaction of Flip Chip Packages with Ultra-low k Interconnects
Abstract / Presentation
Session 12 - Si, Ge and III-V Advanced Technologies
12.3 GRC Krishna Iyengar
Cornell University
Modeling Temperature and Stress Profiles in 3D during Sub-millisecond Laser Spike Annealing
Abstract / Presentation
Session 13 - Logic/Physical Design
13.8 FCRP Zohaib Mahmood
Mass. Institute of Technology
System Level Modeling and Simulation of Analog Circuits Using Semidefinite Programming Based Compact Modeling Techniques
Abstract / Presentation
Session 14 - Data Converter Design
14.9 GRC Jikai Chen
University Univ. of Florida
A 50mW 2.5GS/s 5-Bit ADC in 0.13um CMOS with Background Calibration for In-Situ TDR Measurements
Abstract / Presentation
Session 15 - 3D and Beyond Cu/Low k
15.5 GRC Hyung Suk Yang
Georgia Institute of Technology
Marriage of CMOS and MEMS using Flexible Interconnects and TSVs
Abstract / Presentation
Session 16 - Nano-Scale and Magnetic Devices
16.3 NRI Seyoung Kim
Univ. of Texas/Austin
Coulomb Drag in Independently-Contacted Graphene Bilayers
Abstract / Presentation

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.