R. Scott List
R. Scott List is the Director of Trustworthy and Secure Semiconductors and Systems (T3S) and Innovative and Intelligent Internet of Things (I3T) at Semiconductor Research Corporation. Prior to joining SRC Dr. List was with Intel’s Components Research department for 18 years with management responsibilities including university research, nano-metrology development, 3D IC research, advanced interconnect solutions, decoupling capacitor integration, Intel’s 45 nm silicon technology roadmap, high frequency measurements/simulation and Cu integration. He was also an assignee from Intel at both SRC and IMEC as the director of interconnect research. Before Intel he worked at Texas Instruments for 8 years in research on topics including low k dielectric integration, transistor process and device simulation and HgCdTe infrared focal plane array fabrication and performance enhancement. Scott has co-authored over 100 publications and 50 patents.
List is currently on the organizing committee of the Frontiers of Characterization and Metrology for Nanoelectronics conference. He previously served as the General Chair of the IEEE International Interconnect Technology Conference in 2011 and editor of Electron Device Letters from 2012-2016. Scott was a post-doc at Los Alamos National Laboratory studying high temperature superconductors and graduated from Cornell (B.S., Engineering Physics) and Stanford (Ph.D., Applied Physics).