2010 Technical Excellence Award Presented to Professor Li-C. Wang at TECHCON 2010
[Note: The following is the presentation of the 2010 Technical Excellence Award by Dr. Tze-Chiang Chen, IBM Vice President, Science and Technology, and SRC Board of Directors Chair, at TECHCON 2010.]
The Technical Excellence Award recognizes researchers who have made key contributions to technology that have significantly enhanced the productivity of the semiconductor industry.
This year, the $5000 award is presented to Professor Li-C Wang and his team at the University of California, Santa Barbara, for their work in “Data Mining and Learning for Test and Validation.” Data mining, perhaps more properly called knowledge discovery, is the nontrivial process of identifying valid, novel, potentially useful, and ultimately understandable patterns in data. For example, the Santa Barbara group was able to use timing and other data to determine the characteristics of critical paths in multi-core processors, benefitting several SRC member companies. Professor Wang himself was an SRC-supported student at the University of Texas at Austin, an industrial liaison while at Motorola, and now an SRC-supported investigator on research tasks in both test and verification.
It is a great pleasure, on behalf of the SRC Board of Directors, to present the 2010 Technical Excellence Award to Professor Li-C Wang, supported by his former research assistants Pouri Bastani, a test R & D engineer with Intel in Hillsboro, Oregon, and Benjamin Lee, now with Google.
Please join me in expressing your appreciation for the many years of excellence in research for the SRC community.
View the poster presentation from TECHCON 2010.