Convergence of Software Assurance Methodologies and Trustworthy Semiconductor Design and Manufacture Workshop

This workshop—co-sponsored by SRC, the National Science Foundation (NSF), and Computing Community Consortium (CCC)—explored the current semiconductor design and manufacture tool-chain and strategies for improving trustworthiness and security of semiconductors in light of progress made in the programming language and software development communities.

Agenda
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Tuesday, January 15, 2013
7:30 - 8:30 AM	Continental breakfast
8:30 - 9:00 AM	Welcome and Overview of the Workshop	Keith Marzullo, NSF, Director of Computer and Network Systems Division Workshop Sponsors (Jeremy Epstein, NSF & Celia Merzbacher, SRC)
9:00 - 10:30 AM	Plenary Session 1: Overview of Semiconductor Design and Manufacture (with an eye toward the future)	Moderator – Ron Perez, AMD
	Semiconductor Manufacture Tools & Processes and Potential Vulnerabilities (15 mins)	K. Kemp, Freescale
	Semiconductor Design Tools & Processes and Potential Vulnerabilities (15 mins)	S. Trimberger, Xilinx
	Top-to-bottom integrative design & verification (15 mins)	C. Seger, Intel
	Incorporation of designs from multiple sources (15 mins)	R. Aitken, ARM
	Panel Discussion (30 mins)
10:30 -11:00 AM	Break
11:00 AM - 12:30 AM	Plenary Session 2: Overview of Software Assurance Methodologies	Moderator – Fred Schneider, Cornell
	Thinking about attacks / minimizing trusted base (20 mins)	A. Appel, Princeton
	CompCert as a software tool chain (20 minutes)	D. Pichardie, INRIA/Harvard
	Specifying the HW/SW interface (20 minutes)	P. Sewell, Cambridge
	Panel Discussion (30 mins)
12:30 - 1:30 PM	LUNCH Reality of hardware vulnerability	F. Kiamlev and F. Cayci, U. Delaware
1:30 - 5:00 PM	Breakout sessions (facilitated discussion on specified questions	Facilitators: Jeremy Epstein (NSF), Fred Schneider (Cornell) and Yervant Zorian (Synopsys)
5:00 - 6:00 PM	Preliminary Breakout reports (5 min each; bring forward one or two issues/ideas for consideration by all)
6:00 - 8:00 PM	Reception
Wednesday, January 16, 2013
7:30 - 8:30 AM	Continental breakfast
8:30 - 8:35 AM	Welcome	Suzanne Iacono, Deputy Assistant Director, Directorate for Computer & Information Science & Engineer, NSF
8:30 - 8:35 AM	Opening Remarks	Jeremy Epstein, NSF & Celia Merzbacher, SRC
8:35 - 9:00 AM	Plenary session 3: Further food for thought	Moderator – Ruby Lee, Princeton
8:35 - 9:00 AM	Counterfeit chips: What are the threats? (20 mins + 5 mins Q&A)	M. Tehranipoor, U. Conn.
9:00 - 9:30 AM	Why information flow is different from—and harder than—verifying other kinds of properties (20 mins + 5 mins Q&A)	S. Zdancewic, U. Penn.
9:30 AM - 12:00 PM	Continue Breakout Groups to finalize output (with 15 min break)
12:00 - 1:00 PM	Breakout Group reports & discussion—Working lunch
1:00 - 1:30 PM	Wrap-up
1:30 - 2:00 PM	Adjourn

Name	Organization
Aitken, Robert	Arm Limited
Amla, Nina	National Science Foundation
Appel, Andrew	Princeton University
Ardis, Kris	Maxim Integrated Products
Barrett, Clark	New York University
Bhadra, Jayanta	Freescale Semiconductor, Inc.
Brown, Arnett J.	Booz Allen Hamilton
Cayci, Furkan	University of Delaware
Collins, Chris	Texas Instruments Incorporated
Daverse, Chris A.	Semiconductor Research Corporation
Davidson, Don	U.S. Department of Defense
Epstein, Ben	National Science Foundation
Epstein, Jeremy	National Science Foundation
Fazzari, Saverio	Booz Allen Hamilton
Fisher, Kathleen	DARPA
Halderman, J. Alex	University of Michigan - Ann Arbor
Iacono, Suzanne	National Science Foundation
Joshi, Anupam	University of Maryland, Baltimore County
Joyner, William H.	Semiconductor Research Corporation
Karri, Ramesh	NYU Tandon School of Engineering
Kemp, Kevin G.	Freescale Semiconductor, Inc.
Kiamlev, Fouad	University of Delaware
Koushanfar, Farinaz	Rice University
Kuehlmann, Andreas	Coverity, Inc.
Kuhn, Richard	National Institute of Standards and Technology
Lee, Ruby B.	Princeton University
Levitt, Jeremy	Siemens EDA
Lincoln, Pat	SRI International
Linkov, Igor	U.S. Army
Makki, Rafic	GlobalFoundries Inc.
Martin, Brad	Office of the Director of National Intelligence
Marzullo, Keith	University of California, San Diego
McCants, Carl E.	Office of the Director of National Intelligence
Merzbacher, Celia I.	Semiconductor Research Corporation
Perez, Ronald	Advanced Micro Devices, Inc.
Pichardie, David	INRIA
Plusquellic, Jim	University of Maryland, Baltimore County
Polk, Tim	Office of Science and Technology Policy
Radack, Daniel J.	Institute for Defense Analyses
Rahman, Farhan	Advanced Micro Devices, Inc.
Schneider, Fred B	Cornell University
Seger, Carl-Johan	Intel Corporation
Sewell, Peter	University of Cambridge
Soma, Mani	University of Washington
Song, Peilin	IBM Corporation
Tan, Gang	Lehigh University
Tehranipoor, Mark M.	University of Connecticut
Trimberger, Steve	Xilinx, Inc.
Vedula, Vivekananda M.	Freescale Semiconductor, Inc.
Verbauwhede, Ingrid	University of California, Los Angeles
Zdancewic, Stephan	University of Pennsylvania
Zhao, Fen	Office of Science and Technology Policy
Zorian, Yervant	Synopsys, Inc.

Convergence of Software Assurance Methodologies and Trustworthy Semiconductor Design and Manufacture Workshop

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