Session 17 - Test I (TECHCON 2016)

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Home » Calendar » TECHCON 2016 » Session 17

Tuesday 13-Sep-2016 9:00 - 10:15 AM San Antonio
Session 17 - Test I
17.1 9:00 AM GRC
Harnessing Process Variation Signature for Dynamically Selection of Probe-Test Flow

Ali Ahmadi (UT/Dallas)
17.2 9:15 AM GRC
Hardware Trojans Embedded in the Dynamic Operation of Analog and Mixed-Signal Circuits

Qianqian Wang (Iowa St Univ.)
17.3 9:30 AM GRC
ITV: An EDA Tool to Identify Undesired Operating Point in Analog and Mixed-signal Circuits

Tao Chen (Iowa St Univ.)
17.4 9:45 AM GRC
Enhancing Cell-Aware Fault Detection through Intelligent Use of Scan Shift Cycles

Fanchen Zhang (SMU)
17.5 10:00 AM GRC
ADC Built-in Self-test and Self-healing

Tao Chen (Iowa St Univ.)

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