- Tuesday 13-Sep-2016 10:30 - 11:45 AM San Antonio
- 21.1 10:30 AM GRC
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Assessing the Impact of RTN on Logic Timing Failures Using a 32nm Dual Ring Oscillator Array Based Test StructureQianying Tang (Univ. of Minnesota)
- 21.2 10:45 AM GRC
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BIST-RM: BIST-Assisted Reliability Management of SoCs Using On-Chip Clock Sweeping and Machine LearningMehdi Z. Sadi (Univ. of Florida)
- 21.3 11:00 AM GRC
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Efficiency Analysis for Test-Point Insertion in LBISTMiao He (Univ. of Florida)
- 21.4 11:15 AM GRC
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Retention Testing Methodology for STTRAMAnirudh S. Iyengar (Univ. of South Florida)
- 21.5 11:30 AM GRC
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Achieving Perfect Multi-Defect Diagnosis in Regular CircuitsBenjamin Niewenhuis (Carnegie Mellon Univ., IBM/SRCEA Fellow)
