Session 23 - Interconnect/Dielectric Materials II (TECHCON 2016)

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Tuesday 13-Sep-2016 10:30 - 11:45 AM Sabine
Session 23 - Interconnect/Dielectric Materials II
23.1 10:30 AM GRC
Electric Field Breakdown in Single Molecule Junctions

Haixing Li (Columbia)
23.2 10:45 AM GRC
Using X-ray Reflectivity to Measure the Vacuum-ultraviolet Absorption Spectrum of Low-k Dielectrics

Faraz Choudhury (U of Wisconsin/Madison)
23.3 11:00 AM NRI
Improved Semiconducting Devices Based on Boron Carbide

Elena M. Echeverria (U Nebraska/Lincoln)
23.4 11:15 AM GRC
Understanding Inherent Substrate Selectivity During Tungsten ALD

Paul C. Lemaire (NC State)
23.5 11:30 AM NRI
Passivation of Transition Metal Chalcogenide Surface via Sulfur Layer to Enhanced Metal Contact

Iljo Kwak (UC/San Diego)

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