TECHCON 2017

  • Date:
    Sunday, Sept. 10, 2017, 8 a.m. — Tuesday, Sept. 12, 2017, 10 p.m. CT
    Location:
    Renaissance Austin Hotel, Austin, TX, United States
    Event ID:
    E005108
E005108 image

Thank you to the SRC students, industry, and faculty that attended TECHCON and made it a great success.

Several members from industry conducted a working session with the students on Sunday evening on Interviewing Skills, Resume Writing and Networking.  Jeff Dunn, Intel; Dane Kayce, Micron; Mike Simonek, TI; Kathryn Garner, TEL: Praneet Adusumilli, IBM and Chris Davis, NXP all volunteered to host this informative session for students. Mike Rodriquez, motivational speaker, started the Monday morning kick off session at TECHCON with tips and ideas for the students. Carlos Diaz, Senior Director of Advanced Technology Research in R & D at Taiwan Semiconductor Manufacturing Company was the keynote speaker at Monday night’s dinner

There were also awards recognizing excellence within the SRC community. The 2017 Mahboob Khan Outstanding Liaison Awards were presented at Monday evening’s Conference Banquet.  The 2017 Technical Excellence Award was presented to, Professor Dimitri Antoniadis from MIT for "Metal-Oxide-Semiconductor Field-Effect Transistors Physics, Technology and Modeling". The 2017 Aristotle Award was presented to Professor Jan Rabaey, University of California/Berkeley.

The final event for TECHCON 2017 was presenting Best in Session Awards and the URO Best Poster Awards at Tuesday’s Dinner. Winners are recognized below. Members can also download presentations by session, and there are two large files separating the presentations by day. This year SRC also offered an event schedule application through Guidebook. The mobile version of the application will continue to be available after the event.

 

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.