Biography: Elyse Rosenbaum
Elyse Rosenbaum is the Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign. She received the B.S. degree from Cornell University, the M.S. degree from Stanford University, and the Ph.D. degree from the University of California, Berkeley (1992). Her present research interests include component and system-level ESD reliability, ESD-robust high-speed I/O circuit design, compact modeling, mitigation strategies for ESD-induced soft failures, and machine-learning aided behavioral modeling of microelectronic components and systems.
Dr. Rosenbaum is the director of the NSF-supported Center for Advanced Electronics through Machine Learning (CAEML), a joint project of the University of Illinois, Georgia Tech and North Carolina State University. She is currently an editor for IEEE Transactions on Electron Devices. From 2001 through 2011, she was an editor for IEEE Transactions on Device and Materials Reliability. Dr. Rosenbaum presently chairs the Board of Directors of the International Reliability Physics Symposium.
Dr. Rosenbaum was the recipient of a Best Student Paper Award from the IEDM, as well as Outstanding and Best Paper Awards from the EOS/ESD Symposium. She has received a Technical Excellence Award from the SRC, a NSF CAREER award, an IBM Faculty Award, and the ESD Association’s Industry Pioneer Recognition Award. Dr. Rosenbaum is a Fellow of the IEEE.
Elyse Rosenbaum is the Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign. She received the B.S. degree from Cornell University, the M.S. degree from Stanford University, and the Ph.D. degree from the University of California, Berkeley (1992). Her present research interests include component and system-level ESD reliability, ESD-robust high-speed I/O circuit design, compact modeling, mitigation strategies for ESD-induced soft failures, and machine-learning aided behavioral modeling of microelectronic components and systems.
Dr. Rosenbaum is the director of the NSF-supported Center for Advanced Electronics through Machine Learning (CAEML), a joint project of the University of Illinois, Georgia Tech and North Carolina State University. She is currently an editor for IEEE Transactions on Electron Devices. From 2001 through 2011, she was an editor for IEEE Transactions on Device and Materials Reliability. Dr. Rosenbaum presently chairs the Board of Directors of the International Reliability Physics Symposium.
Dr. Rosenbaum was the recipient of a Best Student Paper Award from the IEDM, as well as Outstanding and Best Paper Awards from the EOS/ESD Symposium. She has received a Technical Excellence Award from the SRC, a NSF CAREER award, an IBM Faculty Award, and the ESD Association’s Industry Pioneer Recognition Award. Dr. Rosenbaum is a Fellow of the IEEE.
