BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Semiconductor Research Corporation/www.src.org/EN
METHOD:PUBLISH
BEGIN:VEVENT
SUMMARY:PRISM eW: Co-Optimizing Performance and Reliability in Oxide Semic
 onductor Transistors: From Doping Engineering to Bayesian Active Learning
DTSTART;VALUE=DATE-TIME:20260923T000000Z
DTEND;VALUE=DATE-TIME:20260923T010000Z
DTSTAMP;VALUE=DATE-TIME:20260915T124440Z
UID:e007984@src.org
CLASS:PUBLIC
CREATED;VALUE=DATE-TIME:20251022T133722Z
LAST-MODIFIED;VALUE=DATE-TIME:20260824T202234Z
LOCATION:via WebEx\, La Jolla\, CA United States
ORGANIZER;CN="Bell, Tameka/SRC":mailto:tameka.bell@src.org
STATUS:CONFIRMED
TRANSP:TRANSPARENT
END:VEVENT
END:VCALENDAR