Viewing 451 - 465 of 553
Method for Diagnosing Bridging Faults in Integrated Circuits
Brian Chess (UC/Santa Cruz); F. Joel Ferguson (UC/Santa Cruz); Tracy Larrabee (UC/Santa Cruz); David B. Lavo (UC/Santa Cruz)Patent Abandoned
Application Type: Continuation (in part)
Method for in-SITU Dry Cleaning, Passivation, and Functionalization of GE Semiconductor Surfaces
Tobin Kaufman-Osborn (UC/San Diego); Kiarash Kiantaj (UC/San Diego); Andrew Kummel (UC/San Diego)Patent Abandoned
Application Type: Utility
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization
Degang Chen (Iowa St Univ.); Randall L. Geiger (Iowa St Univ.); Hanjun Jiang (Iowa St Univ.); Beatriz Olleta (Iowa St Univ.)Patent Abandoned
Application Type: Utility
Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements
Degang Chen (Iowa St Univ.); Randall L. Geiger (Iowa St Univ.); Le Jin (Iowa St Univ.); Turker Kuyel (TI); Kumar L. Parthasarathy (TI)Patent Abandoned
Application Type: Utility
Method of Forming Boron Carbo-Nitride Layers for Integrated Circuit Devices
John G. Ekerdt (UT/Austin); Ward R. Engbrecht (UT/Austin); Kurt Junker (Motorola); Yang Ming Sun (UT/Austin)Patent Abandoned
Application Type: Utility
Method of High Performance CMOS Design
Su I. Kio (Univ. of Washington); Larry McMurchie (Univ. of Washington); Carl Sechen (Univ. of Washington); Tyler J. Thorp (Univ. of Washington); Gin Yee (Univ. of Washington)Patent Abandoned
Application Type: Utility
Method of Locating Areas in an Image Such as a Photo Mask Layout That Are Sensitive to Residual Processing Effects
Frank E. Gennari (UC/Berkeley)Patent Abandoned
Application Type: Continuation (in part)
Methods and Apparatuses for Integrated Packaging of Microelectromechanical Devices
Donald P. Butler (UT/Arlington); Zeynep Celik-Butler (UT/Arlington); Murali M. Chitteboyina (UT/Arlington); Mohammad S. Rahman (UT/Arlington)Patent Abandoned
Application Type: Utility
Methods and Compositions for Forming Patterns with Isolated or Discrete Features Using Block Copolymer Materials
Kostas Daoulas (U of Wisconsin/Madison); Juan de Pablo (U of Wisconsin/Madison); Huiman Kang (U of Wisconsin/Madison); Marcus Mueller (U of Wisconsin/Madison); Paul Nealey (U of Wisconsin/Madison); Mark P. Stoykovich (Univ. Colorado/Boulder)Patent Abandoned
Application Type: Utility
Methods and Compositions for Imaging Acids in Chemically Amplified Photoresists Using pH-Dependent Fluorophores
Scott J. Bukofsky (Yale); Paul M. Dentinger (U of Wisconsin/Madison); Robert Grober (Yale); James Taylor (U of Wisconsin/Madison)Patent Abandoned
Application Type: Utility
Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products
Ronald D. Blanton (Carnegie Mellon Univ.)Patent Abandoned
Application Type: Utility
Methods For Controlling One Or More Temperature Dependent Optical Properties Of A Structure And A System And Product Thereof
Philippe M. Fauchet (Univ. of Rochester); Michael Molinari (Univ. of Reims); Sharon M. Weiss (Univ. of Rochester)Patent Abandoned
Application Type: Utility
Methods for Decreasing Surface Roughness in Novolak-Based Resists
Geoffrey Reynolds (U of Wisconsin/Madison); James Taylor (U of Wisconsin/Madison)Patent Abandoned
Application Type: Utility
Methods for Removing Contaminants on a Substrate
Manuel A. Quevedo-Lopez (Univ. of North Texas); Robert M. Wallace (Univ. of North Texas)Patent Abandoned
Application Type: Utility
Methods of Fabricating Strained Semiconductor-On-Insulator Field-Effect Transistors And Related Devices
Veena Misra (NC State); Mehmet Ozturk (NC State)Patent Abandoned
Application Type: Utility