Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements
Inventors
- Le Jin (Iowa St Univ.)
- Kumar L. Parthasarathy (TI)
- Degang Chen (Iowa St Univ.)
- Randall L. Geiger (Iowa St Univ.)
- Turker Kuyel (TI)
Related Patents
Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements
Degang Chen (Iowa St Univ.); Randall L. Geiger (Iowa St Univ.); Le Jin (Iowa St Univ.); Turker Kuyel (TI); Kumar L. Parthasarathy (TI)Patent Application Expired
Application Type: Provisional
Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements
Degang Chen (Iowa St Univ.); Randall L. Geiger (Iowa St Univ.); Le Jin (Iowa St Univ.); Turker Kuyel (TI); Kumar L. Parthasarathy (TI)Patent Application Expired
Application Type: Patent Cooperation Treaty