Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization

    • Application Type:
      Utility
      Patent Number:
      7587647
      Country:
      United States
      Status:
      Filed on 30-Jul-2004, Issued on 8-Sep-2009, Patent Abandoned
      Organization:
      Iowa State University
      SRC Filing ID:
      P0468

    Inventors

    • Randall L. Geiger (Iowa St Univ.)
    • Degang Chen (Iowa St Univ.)
    • Hanjun Jiang (Iowa St Univ.)
    • Beatriz Olleta (Iowa St Univ.)

    Related Patents

    P0402
    Application Expired
    GRC

    Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization

    Degang Chen (Iowa St Univ.); Randall L. Geiger (Iowa St Univ.); Hanjun Jiang (Iowa St Univ.); Beatriz Olleta (Iowa St Univ.)
    Patent Application Expired
    Application Type: Provisional

    INFORMATION

    FOR MEMBERS

    SRC VALUE

    ACADEMIA

    4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

    © 2024 by Semiconductor Research Corporation ®
    Access to information on this website may be limited to member companies,
    participating agencies, and qualified researchers.

    Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.