Atomic Layer Etching Processes Using Sequential, Self-Limiting Thermal Reactions Comprising Oxidation and Fluorination
Inventors
- Steven George (Univ. Colorado/Boulder)
- Younghee Lee (Univ. Colorado/Boulder)
- Nicholas R. Johnson (Univ. Colorado/Boulder)
Related Patents
New Thermal Atomic Layer Etching Processes Based on Oxidation, Conversion and Fluorination Reactions
Steven George (Univ. Colorado/Boulder); Nicholas R. Johnson (Univ. Colorado/Boulder); Younghee Lee (Univ. Colorado/Boulder)Patent Application Expired
Application Type: Provisional