Testing an Analog-to-Digital Converter Using Counters
Inventors
- Gyusung Park (Univ. of Minnesota)
- Chris H. Kim (Univ. of Minnesota)
Related Patents
A Counter Based In-Situ Non-Linearity Measeurement Circuit in Analog-Digital Converters (ADCs)
Chris H. Kim (Univ. of Minnesota); Gyusung Park (Univ. of Minnesota)Patent Application Expired
Application Type: Provisional