Error Immunity Techniques for Nanomagnetic Logic

  • Authors:
    Jeffrey Bokor (UC/Berkeley), Zheng Gu (UC/Berkeley), Brian Lambson (UC/Berkeley), David Carlton (UC/Berkeley), Scott Dhuey (UC/Berkeley), Andreas Scholl (UC/Berkeley)
    Publication ID:
    Publication Type:
    Received Date:
    Last Edit Date:
    1462.005 (University of California/Los Angeles)


Nanomagnetic logic (NML) is an alternative to electron charge-based information processing for energy efficient computing applications. However, experiments indicate that nanomagnets are susceptible to thermal and lithographic noise, resulting in logical errors during signal transmission and computation. Here, we study the origins of errors in nanomagnetic logic and present a technique for reducing error rates based on anisotropy engineering. Using photoelectron emission microscopy (PEEM), we verify the functionality and error-immunity properties of anisotropy-engineered nanomagnets in NML applications.

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.