Error Immunity Techniques for Nanomagnetic Logic

  • Authors:
    Jeffrey Bokor (UC/Berkeley), Zheng Gu (UC/Berkeley), Brian Lambson (UC/Berkeley), David Carlton (UC/Berkeley), Scott Dhuey (UC/Berkeley), Andreas Scholl (UC/Berkeley)
    Publication ID:
    P065433
    Publication Type:
    Paper
    Received Date:
    29-Nov-2012
    Last Edit Date:
    5-Dec-2012
    Research:
    1462.005 (University of California/Los Angeles)

Abstract

Nanomagnetic logic (NML) is an alternative to electron charge-based information processing for energy efficient computing applications. However, experiments indicate that nanomagnets are susceptible to thermal and lithographic noise, resulting in logical errors during signal transmission and computation. Here, we study the origins of errors in nanomagnetic logic and present a technique for reducing error rates based on anisotropy engineering. Using photoelectron emission microscopy (PEEM), we verify the functionality and error-immunity properties of anisotropy-engineered nanomagnets in NML applications.

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450