FAME: Fault-Attack Awareness using Microprocessor Enhancements

  • Authors:
    Nahid Farhady Ghalaty (Virginia Tech), Bilgiday Yuce (Virginia Tech), Leyla Nazhandali (Virginia Tech), Patrick Schaumont (Virginia Tech)
    Publication ID:
    P084529
    Publication Type:
    Paper
    Received Date:
    23-Jun-2015
    Last Edit Date:
    23-Jun-2015
    Research:
    2552.001 (Virginia Tech)

Abstract

Intentional fault injection into the microprocessors is an important threat to the security of embedded systems. These faults are induced by manipulating the clock or voltage, or intentional induction of laser injections or electromagnetic pulse injections. Fault injections are very powerful tool to extract secure information from cryptographic devices. In this project, we will investigate three aspects of fault injection attacks. First, we investigate new threat models and fault attacks that use more relaxed types of fault injection means. Second, we propose metrics that can evaluate the security of a design against fault attacks and third, we propose design methods and countermeasures against these types of attacks. This project aims at proposing design techniques and strategies to build secure micro-processors that are resistant against fault attacks.

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