High Purity Sine Wave Generation with Low Cost
As data acquisition systems' performance continues to increase, so does the need for characterization solutions to have an input test signal with purity that exceeds what is currently available in state of the art instruments. This paper presents a new method for generating ultra-pure sine wave that can be used in such applications. The pure sine wave is generated by readily available DACs with distortions that could be thousands time worse than the required system purity. Readily available ADC with similar purity as the DAC is used to measure the distortions generated by the DAC. Innovative algorithm is used to iteratively remove distortions present in the generated sine wave. Simulation results verified the proposed method by generating a -145dB ultra-pure sine wave using two DACs and an ADC with -85dB THD.A test board has been designed and results that verify the proposed method will be included in the final paper.
Sunday, Sept. 20, 2015, 8 a.m. — Tuesday, Sept. 22, 2015, 10 p.m. CT
Austin, TX, United States
Technical conference and networking event for SRC members and students.