Advanced Nanoscale Metrology for Semiconductor Applications

  • Authors:
    Margaret Murnane (U. of Colorado/Boulder)
    Publication ID:
    Publication Type:
    Annual Review
    Received Date:
    Last Edit Date:
    2443.001 (University of Colorado/Boulder)


This annual report outlines research accomplishments and plans for future work.

Past Events

  Event Summary
8–9 June 2016
Nanomanufacturing (NMP) Review
Wednesday, June 8, 2016, 8 a.m. — Thursday, June 9, 2016, 5:30 p.m. CT
Chicago, IL, United States

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