Characterization of Backend-of-Line Porous Oxides for RRAM Integration

  • Authors:
    Marius K. Orlowski (Virginia Tech)
    Publication ID:
    P090165
    Publication Type:
    Annual Review
    Received Date:
    31-Jan-2017
    Last Edit Date:
    2-Mar-2017
    Research:
    2579.002 (Virginia Tech)

Abstract

This annual report outlines research accomplishments and plans for future work.

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