Strain and Charge Engineering of Ferroelectric-Gated Mott FETs

  • Authors:
    Xia Hong (U Nebraska/Lincoln)
    Publication ID:
    P090197
    Publication Type:
    Presentation
    Received Date:
    2-Feb-2017
    Last Edit Date:
    2-Feb-2017
    Research:
    2398.002 (University of Nebraska/Lincoln)

Abstract

This presentation was given at the 2016 Workshop on Innovative Nanoscale Devices and Systems (WINDS).

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450