Multi-Modal BIST Design and Test Metrics Evaluation for Analog/RF Circuits
In the first 6 months of the project, we worked on developing parametrizable BIST blocks and system-level BIST evaluation.
|CAD and Test Review|
Monday, May 15, 2017, 1 p.m. — Tuesday, May 16, 2017, 2 p.m. ET
Atlanta, GA, United States