Multi-Modal BIST Design and Test Metrics Evaluation for Analog/RF Circuits

  • Authors:
    Sule Ozev (Arizona State)
    Publication ID:
    P090827
    Publication Type:
    Annual Review
    Received Date:
    4-May-2017
    Last Edit Date:
    5-May-2017
    Research:
    2712.003 (Arizona State University)

Abstract

In the first 6 months of the project, we worked on developing parametrizable BIST blocks and system-level BIST evaluation.

Past Events

  Event Summary
15–16 May 2017
GRC
GRC
CAD and Test Review
Monday, May 15, 2017, 1 p.m. — Tuesday, May 16, 2017, 2 p.m. ET
Atlanta, GA, United States

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

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