Post-Silicon Layout Sensitivity Mining: A Pathway to Defect-Driven Test Quality and Yield Improvement

  • Authors:
    Yiorgos Makris (UT/Dallas)
    Publication ID:
    P090873
    Publication Type:
    Annual Review
    Received Date:
    9-May-2017
    Last Edit Date:
    9-May-2017
    Research:
    2709.001 (University of Texas/Dallas)

Abstract

This annual report outlines research accomplishments and plans for future work.

Past Events

  Event Summary
15–16 May 2017
GRC
GRC
CAD and Test Review
Monday, May 15, 2017, 1 p.m. — Tuesday, May 16, 2017, 2 p.m. ET
Atlanta, GA, United States

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