On-chip Monitors of Supply Noise Generated by System-level ESD

  • Authors:
    Nicholas Thomson (UIUC), Collin M. Reiman (UIUC), Yang Xiu (UIUC), Elyse Rosenbaum (UIUC)
    Publication ID:
    Publication Type:
    Received Date:
    Last Edit Date:
    1836.141 (University of Illinois/Urbana-Champaign)


Two supply noise monitor circuits are demonstrated on a 130-nm test chip. These monitors are capable of providing quantitative measurements of on-chip supply voltage perturbations resulting from system-level ESD. Circuit-level simulations reproduce all trends found in the measurement results.

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.