On-chip Monitors of Supply Noise Generated by System-level ESD

  • Authors:
    Nicholas Thomson (UIUC), Collin M. Reiman (UIUC), Yang Xiu (UIUC), Elyse Rosenbaum (UIUC)
    Publication ID:
    P091111
    Publication Type:
    Presentation
    Received Date:
    14-Jun-2017
    Last Edit Date:
    14-Jun-2017
    Research:
    1836.141 (University of Illinois/Urbana-Champaign)

Abstract

Two supply noise monitor circuits are demonstrated on a 130-nm test chip. These monitors are capable of providing quantitative measurements of on-chip supply voltage perturbations resulting from system-level ESD. Circuit-level simulations reproduce all trends found in the measurement results.

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