Report on Stability of Supply Domains with Integrated Voltage Regulators during System-level ESD

  • Authors:
    Elyse Rosenbaum (UIUC), Yang Xiu (UIUC)
    Publication ID:
    P091146
    Publication Type:
    Deliverable Report
    Received Date:
    21-Jun-2017
    Last Edit Date:
    19-Jul-2017
    Research:
    1836.141 (University of Illinois/Urbana-Champaign)

Research Report Highlight

TxACE researchers at UIUC report that good immunity to ESD-induced noise may be provided by on-chip voltage regulation. The results are validated by measurements from two test chips, by simulation and analysis.

Abstract

On-chip voltage regulation can provide good immunity to ESD-induced noise. Achieving such a favorable outcome generally requires that the internally-generated power supply is not connected to any off-chip decoupling capacitors. These conclusions are validated by measurements taken on two test chips, by circuit simulation, and by analysis.

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