Report on Stability of Supply Domains with Integrated Voltage Regulators during System-level ESD

  • Authors:
    Elyse Rosenbaum (UIUC), Yang Xiu (UIUC)
    Publication ID:
    Publication Type:
    Deliverable Report
    Received Date:
    Last Edit Date:
    1836.141 (University of Illinois/Urbana-Champaign)

Research Report Highlight

TxACE researchers at UIUC report that good immunity to ESD-induced noise may be provided by on-chip voltage regulation. The results are validated by measurements from two test chips, by simulation and analysis.


On-chip voltage regulation can provide good immunity to ESD-induced noise. Achieving such a favorable outcome generally requires that the internally-generated power supply is not connected to any off-chip decoupling capacitors. These conclusions are validated by measurements taken on two test chips, by circuit simulation, and by analysis.

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450