Report on Stability of Supply Domains with Integrated Voltage Regulators during System-level ESD
Research Report Highlight
TxACE researchers at UIUC report that good immunity to ESD-induced noise may be provided by on-chip voltage regulation. The results are validated by measurements from two test chips, by simulation and analysis.
On-chip voltage regulation can provide good immunity to ESD-induced noise. Achieving such a favorable outcome generally requires that the internally-generated power supply is not connected to any off-chip decoupling capacitors. These conclusions are validated by measurements taken on two test chips, by circuit simulation, and by analysis.