Log-normal Statistics in Filamentary RRAM Devices and Related Systems

  • Authors:
    Victor Karpov (Univ. of Toledo), Dipesh Niraula (Univ. of Toledo)
    Publication ID:
    Publication Type:
    Received Date:
    Last Edit Date:
    2654.001 (University of Toledo)


We present a phenomenological theory of the log-normal statistics commonly observed in filamentary resistive memory and related devices. Based on the central limit theorem that statistics are shown to emerge regardless of the underlying material properties when the processes are dominated by thermal activation or tunneling. That takes place in particular for the read-out resistances in the high resistive (OFF) state, but can be observed in the low resistive (ON) state as well. We show that the statistics of switching times becomes log-normal, as observed, when the switching is due to the field induced nucleation. In addition, the statistics of telegraph noise amplitudes is shown to obey the log-normal distribution consistent with the published data.

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.