FAME Fault-attack Aware Microprocessor Extension

  • Authors:
    Patrick Schaumont (Virginia Tech), Leyla Nazhandali (Virginia Tech), Bilgiday Yuce (Virginia Tech), Chinmay Deshpande (Virginia Tech), Marjan Ghodrati (Virginia Tech)
    Publication ID:
    P091236
    Publication Type:
    Annual Review
    Received Date:
    2-Jul-2017
    Last Edit Date:
    25-Jul-2017
    Research:
    2552.001 (Virginia Tech)

Abstract

This presentation summarizes the results of year 3 (ASIC prototype, fault injection software policy design), and plans for the final phase of the project.

Past Events

  Event Summary
13–14 July 2017
GRC
GRC
Trustworthy and Secure Semiconductors and Systems (T3S) Review
Thursday, July 13, 2017, 8 a.m. — Friday, July 14, 2017, 6:30 p.m. ET
Norwood, MA, United States

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

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