FAME Fault-attack Aware Microprocessor Extension

  • Authors:
    Patrick Schaumont (Virginia Tech), Leyla Nazhandali (Virginia Tech), Bilgiday Yuce (Virginia Tech), Chinmay Deshpande (Virginia Tech), Marjan Ghodrati (Virginia Tech)
    Publication ID:
    Publication Type:
    Annual Review
    Received Date:
    Last Edit Date:
    2552.001 (Virginia Tech)


This presentation summarizes the results of year 3 (ASIC prototype, fault injection software policy design), and plans for the final phase of the project.

Past Events

  Event Summary
13–14 July 2017
Trustworthy and Secure Semiconductors and Systems (T3S) Review
Thursday, July 13, 2017, 8 a.m. — Friday, July 14, 2017, 6:30 p.m. ET
Norwood, MA, United States

4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.