Measurement Results for Accurate Spectral Test of ADCs with Multiple Non-idealities Possibly Including Nonlinear Signal Sources, Sinusoidal Amplitude Drift, Frequency Drift, Amplitude-clipping, and Non-coherent Sampling

  • Authors:
    Degang Chen (Iowa St Univ.)
    Publication ID:
    Publication Type:
    Deliverable Report
    Received Date:
    Last Edit Date:
    1836.127 (Iowa State University)

Research Report Highlight

TxACE researchers at Iowa St. introduces three methods to enable low cost testing of high resolutions ADCs that relax the requirements on signal source purity, stability, and precise control over amplitude and frequency.


Accurate spectral testing plays a crucial role in modern high precision ADCs’ evaluation process. One of the challenges is to be able to cost-effectively test the continually higher resolution ADCs accurately. Due to its stringent test requirement, the standard test method for ADCs can be difficult to implement with low cost. This report introduces three main methods that will be able to relax the stringent requirements on signal source purity, stability, precise control over amplitude and frequency. All these methods have been validated by extensive measurement results, to demonstrate their accuracy as well as robustness to resolve the standard test challenges.

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