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EETimes Touts SRC as Benchmark of Industry-Academia Collaboration
SRC performs the kind of long-term research that will keep the United States at the forefront of semiconductor technology, says EETimes.
Press Release
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Two Semiconductor Research Corporation Directors Named as IEEE Fellows
Kwok Ng and Jeff Welser Are Latest from SRC to Receive IEEE Professional Honor
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SEMATECH, SIA and SRC Team to Establish New Collaborative Program for Enabling 3D ICs
Industry pulls together to develop industry standards to guide 3D integration and accelerate technology adoption
Press Release
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Andras Moritz's group was recognized with Best Student Paper award
Andras Moritz's group was recently recognized with the Best Student Paper award.
Article
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Ehsan Afshari, Cornell University, wins Michael Tien Excellence in Teaching Award
Ehsan Afshari, Cornell University, wins Michael Tien Excellence in Teaching Award
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University of Michigan team wins GSRC Margarida Jacome Best Poster/Demo Award
Andrea Pellegrini, University of Michigan, receives GSRC Margarida Jacome Best Poster/Demo Award 2010
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GSRC Research featured in IEEE Spectrum
GSRC Research on Error-Tolerant-Computing featured in November, 2010 issue of IEEE Spectrum
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GRC CADTS Featured Publication
New software produces 15%-20% reduction in mask complexity and cost for 28 nm self-aligned double patterning.
Featured Publication
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GRC NMS Featured Publication
Pluronics enable a simple and inexpensive route to self-assembled resists with selective etch resistance.
Featured Publication
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GRC NMS Featured Publication
CVD grown graphene with tunable band gap of ~1eV has now been demonstrated.
Featured Publication
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GRC DS Featured Publication
Physical model based on defect formation can predict NBTI transient over wide range of parameters.
Featured Publication
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GRC ICSS Featured Publication
New 300 GHz signal generation architecture in CMOS targeted for a spectrometer application.
Featured Publication
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Semiconductor Research Corporation and Waseda University Demonstrate Novel Dopant Solutions That Could Extend Life of Cost-Effective Semiconductor Manufacturing
Team Provides High-Throughput Doping Options, High-Placement Accuracy for 16nm
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2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Conference on Frontiers of Characterization and Metrology for Nanoelectronics Abstract Deadline December 20, 2010
Article
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