Questions?
[x] GRC Science Area
ICSS – Integrated Circuit & Systems Sciences

Content Type
Events 32
Patent Filings 2
Other 1

SRC Program
GRC 29
SRC 6
3D EC 5
FCRP 5

Year
2015 3
2012 1
2011 27
2010 1

Center
C2S2 6
FENA 6
GSRC 6
IFC 6
MSD 6
MuSyC 6
TxACE 5
ACE4S 2
EBSM 2
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
IPC 1
NCRC 1
NPT 1

Thrust/Theme
ISD – Integrated System Design 6
SLD – System Level Design 5
AMS-CSD – Analog/Mixed-Signal Ci... 4
CADT – Computer-Aided Design and... 4
CD – Circuit Design 4
HWS – Hardware Security 4
LPD – Logic & Physical Design 4
TT – Test & Testability 4
VER – Verification 4
I3T – Innovative and Intelligent... 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
DV – Design Verification 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
DesTech – Design Techniques 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
Synthesis & Verification 1
TCAD-MBPS 1
TM – Thermal Management 1
TechCAD – Technology CAD 1

31 through 35 of 35 similar documents, best matches first.   
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31: pdfSRC/NSF Design Forum - Position Statement
NSF/SRC Forum on Future Directions for Design Automation Research Top Three Challenges for Electronic Design Automation Sachin Sapatnekar, University of Minnesota As system ...
URL: https://www.src.org/...hin-sapatnekar-position-statement.pdf
Modified: 2011-08-02 - 15KB
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32: pdfDesign Forum: Bill Read Position Statement
Freescale(tm) and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © Freescale ...
URL: https://www.src.org/...2764/bill-read-position-statement.pdf
Modified: 2011-08-02 - 57KB
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33: Method and Apparatus for Designing Circuits Using High-Level...
Method and Apparatus for Designing Circuits Using High-Level Synthesis Application Type: Utility Patent Number: 7383529 Country: United States Status: Filed on 14-Feb-2005, Issued ...
URL: https://www.src.org/library/patent/p0529/
Modified: 2008-06-03 - 23KB
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34: Sensor Array Design for Consolidated Force Measurement (Patent...
Sensor Array Design for Consolidated Force Measurement Application Type: Utility Patent Number: 11125635 Country: United States Status: Filed on 29-Jun-2018, Issued on 21-Sep-2021 ...
URL: https://www.src.org/library/patent/p1772/
Modified: 2021-09-21 - 22KB
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35: pdfPowerPoint Presentation
Innovate in India OR Make in India What is relevant for companies like Texas Instruments in India? Santhosh Kumar Texas Instruments sant@ti.com Texas Instruments An Overview Our ...
URL: https://www.src.org/calendar/e005563/ti_india_santhosh.pdf
Modified: 2015-02-04 - 2.9MB
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