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| SRC Program |
| GRC | 4 |
| 1 through 4 of 4 similar documents, best matches first. | ||
- 1: Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
- Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB
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- 2: Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
- Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB
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- 3: Method for Automatically Generating Test Vectors for Digital...
- Method for Automatically Generating Test Vectors for Digital Integrated Circuits Application Type: Utility Patent Number: 5377197 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0059/
Modified: 1994-12-27 - 22KB
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- 4: Methods for Characterizing, Generating Test Sequences for, and...
- Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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