Convergence of Software Assurance Methodologies and Trustworthy Semiconductor Design and Manufacture Workshop
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- Date:
- Tuesday, Jan. 15, 2013, 8 a.m. — Wednesday, Jan. 16, 2013, 3 p.m. ET
- Location:
- Waterview Conference Center, Arlington, VA, United States
- Event ID:
- E004965
This workshop—co-sponsored by SRC, the National Science Foundation (NSF), and Computing Community Consortium (CCC)—explored the current semiconductor design and manufacture tool-chain and strategies for improving trustworthiness and security of semiconductors in light of progress made in the programming language and software development communities.
Tuesday, January 15, 2013 | |||
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7:30 - 8:30 AM | Continental breakfast | ||
8:30 - 9:00 AM | Welcome and Overview of the Workshop |
Keith Marzullo, NSF, Director of Computer and Network Systems Division Workshop Sponsors (Jeremy Epstein, NSF & Celia Merzbacher, SRC) |
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9:00 - 10:30 AM | Plenary Session 1: Overview of Semiconductor Design and Manufacture (with an eye toward the future) | Moderator – Ron Perez, AMD | |
Semiconductor Manufacture Tools & Processes and Potential Vulnerabilities (15 mins) | K. Kemp, Freescale | ||
Semiconductor Design Tools & Processes and Potential Vulnerabilities (15 mins) | S. Trimberger, Xilinx | ||
Top-to-bottom integrative design & verification (15 mins) | C. Seger, Intel | ||
Incorporation of designs from multiple sources (15 mins) | R. Aitken, ARM | ||
Panel Discussion (30 mins) | |||
10:30 -11:00 AM | Break | ||
11:00 AM - 12:30 AM | Plenary Session 2: Overview of Software Assurance Methodologies | Moderator – Fred Schneider, Cornell | |
Thinking about attacks / minimizing trusted base (20 mins) | A. Appel, Princeton | ||
CompCert as a software tool chain (20 minutes) | D. Pichardie, INRIA/Harvard | ||
Specifying the HW/SW interface (20 minutes) | P. Sewell, Cambridge | ||
Panel Discussion (30 mins) | |||
12:30 - 1:30 PM | LUNCH Reality of hardware vulnerability |
F. Kiamlev and F. Cayci, U. Delaware | |
1:30 - 5:00 PM | Breakout sessions (facilitated discussion on specified questions | Facilitators: Jeremy Epstein (NSF), Fred Schneider (Cornell) and Yervant Zorian (Synopsys) | |
5:00 - 6:00 PM | Preliminary Breakout reports (5 min each; bring forward one or two issues/ideas for consideration by all) | ||
6:00 - 8:00 PM | Reception | ||
Wednesday, January 16, 2013 | |||
7:30 - 8:30 AM | Continental breakfast | ||
8:30 - 8:35 AM | Welcome | Suzanne Iacono, Deputy Assistant Director, Directorate for Computer & Information Science & Engineer, NSF | |
Opening Remarks | Jeremy Epstein, NSF & Celia Merzbacher, SRC | ||
8:35 - 9:00 AM | Plenary session 3: Further food for thought | Moderator – Ruby Lee, Princeton | |
Counterfeit chips: What are the threats? (20 mins + 5 mins Q&A) | M. Tehranipoor, U. Conn. | ||
9:00 - 9:30 AM | Why information flow is different from—and harder than—verifying other kinds of properties (20 mins + 5 mins Q&A) | S. Zdancewic, U. Penn. | |
9:30 AM - 12:00 PM | Continue Breakout Groups to finalize output (with 15 min break) | ||
12:00 - 1:00 PM | Breakout Group reports & discussion—Working lunch | ||
1:00 - 1:30 PM | Wrap-up | ||
1:30 - 2:00 PM | Adjourn |
Name | Organization |
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Aitken, Robert | Arm Limited |
Amla, Nina | National Science Foundation |
Appel, Andrew | Princeton University |
Ardis, Kris | Maxim Integrated Products |
Barrett, Clark | New York University |
Bhadra, Jayanta | Freescale Semiconductor, Inc. |
Brown, Arnett J. | Booz Allen Hamilton |
Cayci, Furkan | University of Delaware |
Collins, Chris | Texas Instruments Incorporated |
Daverse, Chris A. | Semiconductor Research Corporation |
Davidson, Don | U.S. Department of Defense |
Epstein, Ben | National Science Foundation |
Epstein, Jeremy | National Science Foundation |
Fazzari, Saverio | Booz Allen Hamilton |
Fisher, Kathleen | DARPA |
Halderman, J. Alex | University of Michigan - Ann Arbor |
Iacono, Suzanne | National Science Foundation |
Joshi, Anupam | University of Maryland, Baltimore County |
Joyner, William H. | Semiconductor Research Corporation |
Karri, Ramesh | NYU Tandon School of Engineering |
Kemp, Kevin G. | Freescale Semiconductor, Inc. |
Kiamlev, Fouad | University of Delaware |
Koushanfar, Farinaz | Rice University |
Kuehlmann, Andreas | Coverity, Inc. |
Kuhn, Richard | National Institute of Standards and Technology |
Lee, Ruby B. | Princeton University |
Levitt, Jeremy | Siemens EDA |
Lincoln, Pat | SRI International |
Linkov, Igor | U.S. Army |
Makki, Rafic | GlobalFoundries Inc. |
Martin, Brad | Office of the Director of National Intelligence |
Marzullo, Keith | University of California, San Diego |
McCants, Carl E. | Office of the Director of National Intelligence |
Merzbacher, Celia I. | Semiconductor Research Corporation |
Perez, Ronald | Advanced Micro Devices, Inc. |
Pichardie, David | INRIA |
Plusquellic, Jim | University of Maryland, Baltimore County |
Polk, Tim | Office of Science and Technology Policy |
Radack, Daniel J. | Institute for Defense Analyses |
Rahman, Farhan | Advanced Micro Devices, Inc. |
Schneider, Fred B | Cornell University |
Seger, Carl-Johan | Intel Corporation |
Sewell, Peter | University of Cambridge |
Soma, Mani | University of Washington |
Song, Peilin | IBM Corporation |
Tan, Gang | Lehigh University |
Tehranipoor, Mark M. | University of Connecticut |
Trimberger, Steve | Xilinx, Inc. |
Vedula, Vivekananda M. | Freescale Semiconductor, Inc. |
Verbauwhede, Ingrid | University of California, Los Angeles |
Zdancewic, Stephan | University of Pennsylvania |
Zhao, Fen | Office of Science and Technology Policy |
Zorian, Yervant | Synopsys, Inc. |