Viewing 436 - 450 of 553
Method and Apparatus for Providing Film Stress Measurements Based on Substrates Displacement
Anton F. Jachim (U of Wisconsin/Madison)Patent Abandoned
Application Type: Utility
Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models
Rob A. Rutenbar (Carnegie Mellon Univ.); Sonia Singhal (Carnegie Mellon Univ.); Amith Singhee (Carnegie Mellon Univ.)Patent Abandoned
Application Type: Utility
Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems
Rob A. Rutenbar (Carnegie Mellon Univ.); Amith Singhee (Carnegie Mellon Univ.)Patent Abandoned
Application Type: Utility
Method and Apparatus to Reduce Noise Fluctuation in On-Chip Power Distribution Networks
Eby Friedman (Univ. of Rochester); Olin Hartin (Freescale); Mikhail Popovich (Univ. of Rochester); Radu M. Secareanu (Freescale)Patent Abandoned
Application Type: Utility
Method and Circuit for Reducing Leakage and Increasing Read Stability in a Memory Device
Chris H. Kim (Purdue); Jae-Joon Kim (IBM); Kaushik Roy (Purdue)Patent Abandoned
Application Type: Utility
Method and Circuits for Reducing Dead Time and Reverse Recovery Loss in Buck Regulators
Yuming Bai (Virginia Tech); Alex Q. Huang (Virginia Tech); Nick Sun (Virginia Tech)Patent Abandoned
Application Type: Utility
Method and System for Performing Global Routing on an Integrated Circuit Design
Minsik Cho (UT/Austin); David Z. Pan (UT/Austin)Patent Abandoned
Application Type: Utility
Method and System for Performing Optical Proximity Correction with Process Variations Considerations
David Z. Pan (UT/Austin); Peng Yu (UT/Austin)Patent Abandoned
Application Type: Utility
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification
Kenneth Stevens (Univ. of Utah); Yang Xu (Univ. of Utah)Patent Abandoned
Application Type: Continuation
Method and System for Testing an Electric Circuit
Sukeshwar Kannan (UA/Tuscaloosa); Bruce Kim (UA/Tuscaloosa); Ganesh Srinivasan (TI); Friedrich J. Taenzler (TI)Patent Abandoned
Application Type: Utility
Method and System to Check Correspondence between Different Representations of a Circuit
Edmund M. Clarke (Carnegie Mellon Univ.); Daniel Kroening (Carnegie Mellon Univ.)Patent Abandoned
Application Type: Continuation (in part)
Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design
Edmund M. Clarke (Carnegie Mellon Univ.); Daniel Kroening (Carnegie Mellon Univ.); Karen Yorav (Carnegie Mellon Univ.)Patent Abandoned
Application Type: Utility
Method for Correcting a Mask Design Layout
Puneet Gupta (UC/San Diego); Andrew Kahng (UC/San Diego); Dennis M. Sylvester (Univ. of Michigan); Jie Yang (Univ. of Michigan)Patent Abandoned
Application Type: Utility
Method for Correcting a Mask Design Layout
Puneet Gupta (UC/San Diego); Andrew Kahng (UC/San Diego); Dennis M. Sylvester (Univ. of Michigan); Jie Yang (Univ. of Michigan)Patent Abandoned
Application Type: Continuation
METHOD FOR CORRECTING A MASK DESIGN LAYOUT
Puneet Gupta (UC/San Diego); Andrew Kahng (UC/San Diego); Dennis M. Sylvester (Univ. of Michigan); Jie Yang (Univ. of Michigan)Patent Abandoned
Application Type: Utility