[x]
Thrust/Theme
TT – Test & Testability
[x]
Content Type
Patent Filings
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| 1 through 7 of
7 similar documents, best matches first. |
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- 1:
Cost Effective DAC Linearization System (Patent P1749) - SRC
- Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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- 2:
Signal Generator with Self-Calibration (Patent P1736) - SRC
- Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
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- 3:
Test Pattern Generation for an Electronic Circuit Using a Transformed...
- Test Pattern Generation for an Electronic Circuit Using a Transformed Circuit Description Application Type: Utility Patent Number: 5528604 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0075/
Modified: 1996-06-18 - 22KB
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- 4:
Systems and Methods for Testing Integrated Circuits (Patent P0342...
- Systems and Methods for Testing Integrated Circuits Application Type: Utility Patent Number: 7032151 Country: United States Status: Filed on 13-Nov-2002, Issued on 18-Apr-2006, ...
URL: https://www.src.org/library/patent/p0342/
Modified: 2006-04-18 - 22KB
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- 5:
High Speed Data Converter Testing Devices, Methods, & System...
- High Speed Data Converter Testing Devices, Methods, & System Application Type: Utility Patent Number: 7250882 Country: United States Status: Filed on 3-Mar-2006, Issued on ...
URL: https://www.src.org/library/patent/p0612/
Modified: 2007-07-31 - 22KB
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- 6:
Systems and Methods for Electromagnetic Band Gap Structure Sythesis...
- Systems and Methods for Electromagnetic Band Gap Structure Sythesis Application Type: Utility Patent Number: 8060457 Country: United States Status: Filed on 13-Sep-2007, Issued on ...
URL: https://www.src.org/library/patent/p1039/
Modified: 2011-11-15 - 22KB
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- 7:
Methods for Characterizing, Generating Test Sequences for, and...
- Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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7 similar documents, best matches first. |
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