Test Pattern Generation for an Electronic Circuit Using a Transformed Circuit Description

• Application Type:

  Utility

  Patent Number:

  5528604

  Country:

  United States

  Status:

  Filed on 18-Jan-1995, Issued on 18-Jun-1996, Patent Expired

  Organization:

  Carnegie Mellon University

  SRC Filing ID:

  P0075

Inventors

• Aiman El-maleh (Siemens EDA)
• Wojciech Maly (Carnegie Mellon Univ.)
• Thomas E. Marchok (Carnegie Mellon Univ.)
• Janusz Rajski (Siemens EDA)