[x]
GRC Science Area
DES – Design Sciences
|
1 through 10 of
10 similar documents, best matches first. |
|
- 1:
Semiconductor Research Corporation - SRC
- GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB Find Similar Documents
- 2:
Built-in Current Testing of Integrated Circuits (Patent P0109...
- Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB Find Similar Documents
- 3:
ESD/EOS Protection Circuits for Integrated Circuits (Patent P0074...
- ESD/EOS Protection Circuits for Integrated Circuits Application Type: Utility Patent Number: 5450267 Country: United States Status: Filed on 31-Mar-1993, Issued on 12-Sep-1995, ...
URL: https://www.src.org/library/patent/p0074/
Modified: 1995-09-12 - 25KB Find Similar Documents
- 4:
Method for Diagnosing Bridging Faults in Integrated Circuits...
- Method for Diagnosing Bridging Faults in Integrated Circuits Application Type: Utility Patent Number: 6202181 Country: United States Status: Filed on 3-Nov-1997, Issued on ...
URL: https://www.src.org/library/patent/p0199/
Modified: 2001-03-13 - 23KB Find Similar Documents
- 5:
Method for Automatically Generating Test Vectors for Digital...
- Method for Automatically Generating Test Vectors for Digital Integrated Circuits Application Type: Utility Patent Number: 5377197 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0059/
Modified: 1994-12-27 - 22KB Find Similar Documents
- 6:
Method for Diagnosing Bridging Faults in Integrated Circuits...
- Method for Diagnosing Bridging Faults in Integrated Circuits Application Type: Continuation (in part) Patent Number: 6560736 Country: United States Status: Filed on 10-Jan-2001, ...
URL: https://www.src.org/library/patent/p0338/
Modified: 2003-05-06 - 23KB Find Similar Documents
- 7:
Methods for Characterizing, Generating Test Sequences for, and...
- Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB Find Similar Documents
- 8:
Source Contact Placement for Efficient ESD/EOS Protection in...
- Source Contact Placement for Efficient ESD/EOS Protection in Grounded Substrate MOS Integrated Circuit Application Type: Utility Patent Number: 5404041 Country: United States ...
URL: https://www.src.org/library/patent/p0067/
Modified: 1995-04-04 - 25KB Find Similar Documents
- 9:
Method of placing source contacts for efficient EDS\EOS protection...
- Method of placing source contacts for efficient EDS\EOS protection in grounded substrate MOS integrated circuit Application Type: Divisional Patent Number: 5468667 Country: United ...
URL: https://www.src.org/library/patent/p0373/
Modified: 1995-11-21 - 22KB Find Similar Documents
- 10:
Methods, Apparatus and Computer Program products for Synthesizing...
- Methods, Apparatus and Computer Program products for Synthesizing Integrated Circuits with Electrostatic Discharge Capability and Correcting Ground Rule Faults Therein Application ...
URL: https://www.src.org/library/patent/p0049/
Modified: 1998-08-18 - 27KB Find Similar Documents
1 through 10 of
10 similar documents, best matches first. |
|
|
|