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Thrust/Theme
CADT – Computer-Aided Design and Test
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Slide 1
- Third Annual India Design Review January 7-8, 2015 William H. Joyner, Jr. CADTS William.Joyner@src.org David C. Yeh ICSS David.Yeh@src.org Restricted Distribution: Contains SRC ...
URL: https://www.src.org/...r/e005563/2015_indiawelcome_final.pdf
Modified: 2015-02-04 - 319KB Find Similar Documents
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Semiconductor Research Corporation - SRC
- GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB Find Similar Documents
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DYNAMIC-ZOOM ANALOG TO DIGITAL CONVERTER (ADC) HAVING A COARSE...
- DYNAMIC-ZOOM ANALOG TO DIGITAL CONVERTER (ADC) HAVING A COARSE FLASH ADC AND A FINE PASSIVE SINGLE-BIT MODULATOR Application Type: Utility Patent Number: 10541706 Country: United ...
URL: https://www.src.org/library/patent/p1782/
Modified: 2020-01-21 - 26KB Find Similar Documents
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Signal Generator with Self-Calibration (Patent P1736) - SRC
- Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB Find Similar Documents
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India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB Find Similar Documents
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Evaluating Functional Fault Criticality of Structural Faults...
- Evaluating Functional Fault Criticality of Structural Faults for Circuit Testing Application Type: Utility Patent Number: 12008298 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1929/
Modified: 2024-06-11 - 29KB Find Similar Documents
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