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Thrust/Theme
DCMOS – Digital CMOS Technologies
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1 through 7 of
7 similar documents, best matches first. |
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- 1:
Method for In-Situ Dry Cleaning, Passivation, Functionalization...
- Method for In-Situ Dry Cleaning, Passivation, Functionalization of SI-GE Semiconductor Surfaces Application Type: Utility Patent Number: 9818599 Country: United States Status: ...
URL: https://www.src.org/library/patent/p1429/
Modified: 2017-11-14 - 25KB Find Similar Documents
- 2:
Method for in-SITU Dry Cleaning, Passivation, and Functionalization...
- Method for in-SITU Dry Cleaning, Passivation, and Functionalization of GE Semiconductor Surfaces Application Type: Utility Patent Number: 9117653 Country: United States Status: ...
URL: https://www.src.org/library/patent/p1477/
Modified: 2015-08-25 - 25KB Find Similar Documents
- 3:
Method for Cleaning, Passivation and Functionalization of SI...
- Method for Cleaning, Passivation and Functionalization of SI-GE Semiconductor Sufraces Application Type: Divisional Patent Number: 10483097 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1734/
Modified: 2019-11-19 - 25KB Find Similar Documents
- 4:
High Capacitance Density Gate Dielectrics for III-V Semiconductor...
- High Capacitance Density Gate Dielectrics for III-V Semiconductor Channels Using a Pre-Disposition Surface Treatment Involving Plasma and Ti Precursor Exposure Application Type: ...
URL: https://www.src.org/library/patent/p1506/
Modified: 2015-11-17 - 22KB Find Similar Documents
- 5:
Semiconductor Research Corporation - SRC
- GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB Find Similar Documents
- 6:
Methods of Fabricating Strained Semiconductor-On-Insulator Field...
- Methods of Fabricating Strained Semiconductor-On-Insulator Field-Effect Transistors And Related Devices Application Type: Utility Patent Number: 7211458 Country: United States ...
URL: https://www.src.org/library/patent/p0523/
Modified: 2007-05-01 - 22KB Find Similar Documents
- 7:
Scanning Probe Characterization of Surfaces (Patent P0618) -...
- Scanning Probe Characterization of Surfaces Application Type: Utility Patent Number: 7420106 Country: United States Status: Filed on 15-Mar-2006, Issued on 2-Sep-2008, Patent ...
URL: https://www.src.org/library/patent/p0618/
Modified: 2008-09-02 - 22KB Find Similar Documents
1 through 7 of
7 similar documents, best matches first. |
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