Questions?
[x] Thrust/Theme
TT – Test & Testability
Content Type
Patent Filings 3
Events 2
Other 1
SRC Program
GRC 6
Year
2015 2
Center
TxACE 3
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
EBSM 1
IPC 1
NCRC 1
GRC Science Area
CADTS – Computer Aided Design & ... 6
ICSS – Integrated Circuit & Syst... 3
CSR – Cross-disciplinary Semicon... 1
DES – Design Sciences 1
DS – Device Sciences 1
ES-H – Environmental Safety & He... 1
FAC – Factory Sciences 1
GEN – General 1
INT – Interconnect Sciences 1
IPS – Interconnect & Packaging S... 1
ISA – Industrial Support Activit... 1
LIT – Lithography Sciences 1
MBP – Materials & Bulk Processes... 1
MFG – Manufacturing Sciences 1
MFGPS – Manufacturing Process Sc... 1
MIC – Microstructure Sciences 1
MPS – Material & Process Science... 1
MSS – Manufacturing Systems Scie... 1
NIS – Nanostructure & Integratio... 1
NMS – Nanomanufacturing Sciences 1
PID – Process Integration & Devi... 1
PKG – Packaging Sciences 1
SMS – Semiconductor Modeling & S... 1
SRCEA – SRC Education Alliance 1
TT – Technology Transfer 1
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Modified: 2023-10-10 - 33KB
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Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10788532 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1753/
Modified: 2020-09-29 - 26KB
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4: Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
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Innovate in India OR Make in India What is relevant for companies like Texas Instruments in India? Santhosh Kumar Texas Instruments sant@ti.com Texas Instruments An Overview Our ...
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