Questions?
[x] Content Type
Patent Filings
SRC Program
GRC 328
FCRP 113
STARnet 66
JUMP 37
NRI 15
MSR-Intel 2
nCORE 2
ERI 1
Center
IFC 51
C2S2 26
ACE4S 22
ASCENT 21
GSRC 20
C-SPIN 19
LEAST 19
TxACE 17
C-FAR 11
FENA 9
SONIC 9
CRISP 7
MSD 7
FAME 6
SWAN 5
MIND 4
CBRIC 3
CNFD 3
CONIX 3
ComSenTer 3
TerraSwarm 3
E2CDA-NRI 2
EBSM 2
CEMPI 1
CHIRP 1
IMPACT 1
INDEX 1
MuSyC 1
NCRC 1
NEWLIMITS 1
SGRC 1
Thrust/Theme
CD – Circuit Design 33
TT – Test & Testability 32
SLD – System Level Design 23
PAT – Patterning 22
I3T – Innovative and Intelligent... 21
ISD – Integrated System Design 17
LPD – Logic & Physical Design 16
Advanced Devices & Technologies 14
Pat(MPS) – Patterning 14
CADT – Computer-Aided Design and... 13
ASCENT-T1 – Vertical CMOS 12
AMS-CSD – Analog/Mixed-Signal Ci... 11
Factory Systems 10
HWS – Hardware Security 10
BEP – Back End Processes 9
ASCENT-T2 – Beyond CMOS 8
PKG – Packaging 8
NMP – Nanomanufacturing Material... 7
Back End Processes 5
CFM&TCM – CFM & Total Chemical M... 5
CRISP-T1 – Hardware Support for ... 5
DCMOS – Digital CMOS Technologie... 5
NEM – Nanoengineered Materials 5
VER – Verification 5
DesTech – Design Techniques 4
MT – Memory Technologies 4
Packaging & Interconnect Systems 4
AIHW – Artificial Intelligence H... 3
CONIX-T1 – ARENA Integrator 3
MTMP – Metrology Tools Matls & P... 3
PatMat – Patterning Materials 3
SemiSynBio – Semiconductor Synth... 3
ADS – Alternative Device Structu... 2
CBRIC-T2 – Neuromorphic Fabrics 2
CRISP-T3 – Scaling Applications ... 2
ComSenTer-T1 – Systems and Algor... 2
Doping Technologies 2
ESH – Environment Safety and Hea... 2
Masks 2
Materials 2
Physical Design 2
TechCAD – Technology CAD 2
AMS – Analog and Mixed-Signal De... 1
ASCENT-T4 – Merged Logic Memory ... 1
AdvTech – Advanced Technology 1
CBRIC-T1 – Neuro-inspired Algori... 1
CM – Compact Modeling 1
ComSenTer-T2 – mm-wave/THz ICs a... 1
DV – Design Verification 1
Deposition 1
DesSyn – Design Synthesis 1
Front End Processes 1
IMPACT-T1 – Materials for Scaled... 1
Lithography 1
Metrology 1
Modeling & Simulation 1
NEWLIMITS-T3 – Advanced Manufact... 1
Processes – Processes 1
Reliability 1
Synthesis & Verification 1
GRC Science Area
MPS – Material & Process Science... 74
CADTS – Computer Aided Design & ... 66
ICSS – Integrated Circuit & Syst... 56
NIS – Nanostructure & Integratio... 45
NMS – Nanomanufacturing Sciences 43
LIT – Lithography Sciences 28
DS – Device Sciences 20
DES – Design Sciences 18
IPS – Interconnect & Packaging S... 18
MBP – Materials & Bulk Processes... 13
MIC – Microstructure Sciences 12
PID – Process Integration & Devi... 12
INT – Interconnect Sciences 5
MFGPS – Manufacturing Process Sc... 3
ES-H – Environmental Safety & He... 1
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1: Methods and Systems for Evaluating the Length of Elongated Elements...
Methods and Systems for Evaluating the Length of Elongated Elements Application Type: Utility Patent Number: 7835870 Country: United States Status: Filed on 1-Nov-2005, Issued on ...
URL: https://www.src.org/library/patent/p0593/
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URL: https://www.src.org/library/patent/p1396/
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10: Systems and Methods for Distortion Measurement using Distortion...
Systems and Methods for Distortion Measurement using Distortion-to-Amplitude Transformations Application Type: Utility Patent Number: 8358169 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1637/
Modified: 2013-01-22 - 23KB
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11: Systems and Methods for Filtering and Computation Using Tunnellling...
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URL: https://www.src.org/library/patent/p1579/
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12: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
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13: Generic Cell Controlling Method and Apparatus for Computer Integrated...
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URL: https://www.src.org/library/patent/p0029/
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14: System and Method for Statistical Post-Silicon Validation (Patent...
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15: Systems and Methods for Electromagnetic Band Gap Structure Sythesis...
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URL: https://www.src.org/library/patent/p1039/
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Method and System for Performing Optical Proximity Correction with Process Variations Considerations Application Type: Utility Patent Number: 7711504 Country: United States Status: ...
URL: https://www.src.org/library/patent/p1031/
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URL: https://www.src.org/library/patent/p1032/
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19: Method and System for Synthesizing Relative Timing Constraints...
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URL: https://www.src.org/library/patent/p1354/
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20: Memory Systems Including Support for Transposition Operations...
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1 through 30 of 559 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 8 9 10 next >>