System and Method to Test Integrated Circuits on a Wafer

• Application Type:

  Utility

  Patent Number:

  7325180

  Country:

  United States

  Status:

  Filed on 26-Nov-2003, Issued on 29-Jan-2008, Patent Abandoned

  Organization:

  Carnegie Mellon University

  SRC Filing ID:

  P0413

Inventors

• Ronald D. Blanton (Carnegie Mellon Univ.)
• Lawrence Pileggi (Carnegie Mellon Univ.)
• C. Patrick Yue (Carnegie Mellon Univ.)
• Thomas Vogels (Carnegie Mellon Univ.)