Systems and Methods for Distortion Measurement using Distortion-to-Amplitude Transformations
Inventors
- Shreyas Sen (Purdue)
- Shyam Kumar Devarakond (Intel)
- Abhijit Chatterjee (Georgia Tech)
Related Patents
Low Cost AM/AM and AM/PM Distortion Measurement Using Distortion-to-Amplitude Transformations
Abhijit Chatterjee (Georgia Tech); Shyam Kumar Devarakond (Intel); Shreyas Sen (Purdue)Patent Application Expired
Application Type: Provisional