Systems and Methods for Measuring I-Q Mismatch
Inventors
- Shreyas Sen (Georgia Tech)
- Shyam Kumar Devarakond (Georgia Tech)
- Abhijit Chatterjee (Georgia Tech)
Related Patents
IQ Mismatch Measurement and Compensation using Only Built In Power Detector Utilizing Phase to Amplitude Coversion
Abhijit Chatterjee (Georgia Tech); Shyam Kumar Devarakond (Georgia Tech); Shreyas Sen (Georgia Tech)Patent Application Expired
Application Type: Provisional