Questions?
[x] SRC Program
GRC

[x] GRC Science Area
CADTS – Computer Aided Design & Test Sciences

Content Type
Patent Filings 70
Events 8
Other 1

Year
2015 2
2011 6

Center
TxACE 5
C2S2 2
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
EBSM 1
GSRC 1
IPC 1
NCRC 1

Thrust/Theme
TT – Test & Testability 33
LPD – Logic & Physical Design 22
CADT – Computer-Aided Design and... 13
VER – Verification 8
DesTech – Design Techniques 6
Physical Design 5
TechCAD – Technology CAD 4
AMS-CSD – Analog/Mixed-Signal Ci... 3
CD – Circuit Design 3
HWS – Hardware Security 3
ISD – Integrated System Design 3
SLD – System Level Design 3
DV – Design Verification 2
DesSyn – Design Synthesis 2
I3T – Innovative and Intelligent... 2
Modeling & Simulation 2
Synthesis & Verification 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Deposition 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1

1 through 30 of 79 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 next >>
1: 3D IC University Research e-Workshop (Event E004357) - SRC
3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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2: Semiconductor Research Corporation - SRC
GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB
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3: pdfFinal Report - Workshop on Failure and Uncertainty in Mixed-Signal...
National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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4: pdfSlide 1
Third Annual India Design Review January 7-8, 2015 William H. Joyner, Jr. CADTS William.Joyner@src.org David C. Yeh ICSS David.Yeh@src.org Restricted Distribution: Contains SRC ...
URL: https://www.src.org/...r/e005563/2015_indiawelcome_final.pdf
Modified: 2015-02-04 - 319KB
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5: pdfSlide 1
3D University Research Summit May 5 th , 2011 Restricted Distribution: Contains SRC Confidential Material Restricted Distribution: Contains SRC Confidential Material Summit Goals . ...
URL: https://www.src.org/calendar/e004357/0-intro.pdf
Modified: 2011-05-04 - 285KB
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6: pdfSRC/NSF Design Forum - Position Statement
SRC/NSF Workshop on Future Directions for Design Automation Research Comments by David Yeh, Texas Instruments, currently an assignee at SRC I approached this from two perspectives. ...
URL: https://www.src.org/...2764/david-yeh-position-statement.pdf
Modified: 2011-08-02 - 12KB
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7: pdfPresentation Title
PAGE 1 QUALCOMM CONFIDENTIAL AND PROPRIETARY QUALCOMM CONFIDENTIAL AND PROPRIETARY qctconnect.com 3D Through Si Stacking Technology - an IFM Perspective - RikoR May 11 PAGE 2 ...
URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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8: Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10788532 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1753/
Modified: 2020-09-29 - 26KB
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9: Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10845416 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1752/
Modified: 2020-11-24 - 26KB
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10: Software-Based Self-Test and Diagnosis Using On-Chip Memory ...
Software-Based Self-Test and Diagnosis Using On-Chip Memory Application Type: Utility Patent Number: 9864007 Country: United States Status: Filed on 30-Apr-2014, Issued on ...
URL: https://www.src.org/library/patent/p1457/
Modified: 2018-01-09 - 25KB
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11: Signal Tracing Using On-Chip Memory For In-System Post-Fabrication...
Signal Tracing Using On-Chip Memory For In-System Post-Fabrication Debug Application Type: Utility Patent Number: 9720036 Country: United States Status: Filed on 18-Aug-2014, ...
URL: https://www.src.org/library/patent/p1495/
Modified: 2017-08-01 - 23KB
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12: Signal Tracing using ON-Chip Memory for In-System Post-Fabrication...
Signal Tracing using ON-Chip Memory for In-System Post-Fabrication Debug Application Type: Continuation Patent Number: 10732221 Country: United States Status: Filed on 26-Jun-2017, ...
URL: https://www.src.org/library/patent/p1733/
Modified: 2020-08-04 - 24KB
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13: Built-in Current Testing of Integrated Circuits (Patent P0109...
Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB
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14: Method of Fabricating a Self-Aligned High Speed MOSFET Device...
Method of Fabricating a Self-Aligned High Speed MOSFET Device Application Type: Continuation (in part) Patent Number: 5599728 Country: United States Status: Filed on 28-Oct-1994, ...
URL: https://www.src.org/library/patent/p0006/
Modified: 1997-02-04 - 22KB
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15: Dynamic Threshold Voltage Mosfet Having Gate to Body Connection...
Dynamic Threshold Voltage Mosfet Having Gate to Body Connection for Ultra-Low Voltage Operation Application Type: Utility Patent Number: 5559368 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0004/
Modified: 1996-09-24 - 22KB
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16: Silicon-On-Insulator Transistors Having Improved Current Characteristi...
Silicon-On-Insulator Transistors Having Improved Current Characteristics and Reduced Electrostatic Discharge Susceptibility Application Type: Utility Patent Number: 5489792 ...
URL: https://www.src.org/library/patent/p0026/
Modified: 1996-02-06 - 22KB
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17: Silicon-on-insulator transistors having improved current characteristi...
Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility Application Type: Divisional Patent Number: 5982003 ...
URL: https://www.src.org/library/patent/p0002/
Modified: 1999-11-09 - 22KB
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18: Cell-Level Signal Electromigration (Patent P1459) - SRC
Cell-Level Signal Electromigration Application Type: Utility Patent Number: 9665680 Country: United States Status: Filed on 30-May-2014, Issued on 30-May-2017 Organization: ...
URL: https://www.src.org/library/patent/p1459/
Modified: 2017-05-30 - 22KB
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19: Characterization Of Radio Frequency (RF) Signals Using Wavelet...
Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
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20: Gas-Solid Photocatalytic Oxidation of Environmental Pollutants...
Gas-Solid Photocatalytic Oxidation of Environmental Pollutants Application Type: Utility Patent Number: 5045288 Country: United States Status: Filed on 15-Sep-1989, Issued on ...
URL: https://www.src.org/library/patent/p0107/
Modified: 1991-09-03 - 22KB
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21: Apparatus for Detecting Bugs in Logic-Based Processing Devices...
Apparatus for Detecting Bugs in Logic-Based Processing Devices Application Type: Utility Patent Number: 10120737 Country: United States Status: Filed on 18-Feb-2016, Issued on ...
URL: https://www.src.org/library/patent/p1597/
Modified: 2018-11-06 - 23KB
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22: Testing Monolithic Three Dimensional Integrated Circuits (Patent...
Testing Monolithic Three Dimensional Integrated Circuits Application Type: Utility Patent Number: 10775429 Country: United States Status: Filed on 2-Nov-2017, Issued on 15-Sep-2020 ...
URL: https://www.src.org/library/patent/p1746/
Modified: 2020-09-15 - 25KB
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23: Quantifier Elimination by Dependency Sequents (Patent P1309)...
Quantifier Elimination by Dependency Sequents Application Type: Utility Patent Number: 8438513 Country: United States Status: Filed on 30-Dec-2011, Issued on 7-May-2013, Patent ...
URL: https://www.src.org/library/patent/p1309/
Modified: 2013-05-07 - 22KB
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24: Obstruction-Aware Cache Management (Patent P1410) - SRC
Obstruction-Aware Cache Management Application Type: Utility Patent Number: 9223716 Country: United States Status: Filed on 4-Oct-2013, Issued on 29-Dec-2015, Patent Abandoned ...
URL: https://www.src.org/library/patent/p1410/
Modified: 2015-12-29 - 22KB
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25: Single-Mask Double-Patterning Lithography (Patent P1185) - SRC
Single-Mask Double-Patterning Lithography Application Type: Utility Patent Number: 8415089 Country: United States Status: Filed on 15-Mar-2010, Issued on 9-Apr-2013, Patent ...
URL: https://www.src.org/library/patent/p1185/
Modified: 2013-04-09 - 22KB
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26: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
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27: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
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28: Cost Effective DAC Linearization System (Patent P1749) - SRC
Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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29: Signal Generator with Self-Calibration (Patent P1736) - SRC
Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
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30: Asynchronous Finite State Machines (Patent P1610) - SRC
Asynchronous Finite State Machines Application Type: Utility Patent Number: 10310994 Country: United States Status: Filed on 28-Feb-2017, Issued on 4-Jun-2019 Organization: ...
URL: https://www.src.org/library/patent/p1610/
Modified: 2019-06-04 - 22KB
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1 through 30 of 79 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 next >>