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- 1:
TECHCON 2011 (Event E004113) - SRC
- TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB
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- 2:
TECHCON 2010 Evaluation Summary - SRC
- TECHCON 2010 Evaluation Summary Overall, 134 TECHCON attendees returned evaluations; breakdown by question is: The papers/posters presented indicate research of value to the ...
URL: https://www.src.org/calendar/e003428/evaluation/
Modified: 2010-09-30 - 26KB
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- 3:
TECHCON 2010 Preview - SRC
- TECHCON 2010 Preview TECHCON is the primary event where SRC presents the best of research sponsored by the membership and showcases the students who perform the research. It is ...
URL: https://www.src.org/calendar/e003428/preview/
Modified: 2010-07-28 - 24KB
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- 4:
TECHCON 2012 (Event E004114) - SRC
- TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB
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- 5:
Semiconductor Research Corporation - SRC
- FCRP FCRP Focus Center Research Program (Legacy) Multi-Scale Systems Research Center Creation of a comprehensive and a systematic solution to the distributed multi-scale system ...
URL: https://www.src.org/program/fcrp/
Modified: 2023-10-10 - 32KB
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- 6:
 Fellowships and Scholarships
- Renaissance Hotel Austin, TX September 13-14, 2010 Showcasing . The quality of the research portfolio . The excellence of SRC students and faculty . The magnitude of the ...
URL: https://www.src.org/calendar/e003428/poster.pdf
Modified: 2010-06-21 - 207KB
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- 7:
2010 Inventor Recognition Award Winners - SRC
- Inventor Recognition Awards Presented at TECHCON 2010 [Note: The following is the presentation of the 2009 Inventor Recognition Awards by Elizabeth Weitzman, SRC Executive Vice ...
URL: https://www.src.org/calendar/e003428/inventor/
Modified: 2010-09-29 - 21KB
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- 8:
Description
- Call for Abstracts Call for abstracts opens Monday, January 16, 2012. Deadline for submission is 3:00 p.m. eastern time on Wednesday, February 22, 2012. Description TECHCON is ...
URL: https://www.src.org/calendar/e004114/call-for-abstracts.pdf
Modified: 2012-01-26 - 27KB
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- 9:
TechFair at TECHCON 2010 - SRC
- TechFair at TECHCON 2010 Over the two days of TECHCON 2010, TechFair will provide the forum for networking and synergy between industry and university researchers, and between ...
URL: https://www.src.org/calendar/e003428/techfair/
Modified: 2010-08-04 - 21KB
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- 10:
TECHCON 2010: A Tradition of High Quality - SRC
- TECHCON 2010: Technology and Talent for the 21st Century A Tradition of High Quality Since its inception in 1990, the quality of presentations at TECHCON Conferences has gotten ...
URL: https://www.src.org/calendar/e003428/tradition/
Modified: 2010-06-21 - 21KB
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- 11:
Slide 1
- Renaissance Hotel Austin, TX September 12-13, 2011 . student presentations . broad research spectrum . networking global research collaboration, focus center research program and ...
URL: https://www.src.org/calendar/e004113/flyer.pdf
Modified: 2010-12-15 - 169KB
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- 12:
Carbon-based Electronics Workshop (Event E004815) - SRC
- Carbon-based Electronics Workshop Date: Thursday, Sept. 20, 2012, 5 p.m. - Friday, Sept. 21, 2012, 4 p.m. ET Location: Massachusetts Institute of Technology, Building E15, ...
URL: https://www.src.org/calendar/e004815/
Modified: 2013-03-21 - 25KB
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- 13:
TECHCON 2010 Best in Session Awards - SRC
- TECHCON 2010 Best in Session Awards Seventeen students received Best in Session Awards at TECHCON 2010, presented by Dr. Michael Mayberry, Intel, SRC Board of Directors Member ...
URL: https://www.src.org/calendar/e003428/best-in-session/
Modified: 2010-09-29 - 26KB
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- 14:
TECHCON 2010: Author's Kit - Judging Criteria - SRC
- TECHCON 2010: Technology and Talent for the 21st Century Judging Criteria Criteria Technical Content 0 - 35 points Perceived Value 0 - 15 points Technology / Information Transfer 0 ...
URL: https://www.src.org/calendar/e003428/judging-criteria/
Modified: 2010-06-21 - 24KB
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- 15:
Judging Criteria - TECHCON 2011 Author's Kit - SRC
- TECHCON 2011 Author's Kit Judging Criteria Criteria Technical Content 0 - 35 points Perceived Value 0 - 15 points Technology / Information Transfer 0 - 20 points Presentation ...
URL: https://www.src.org/calendar/e004113/judging-criteria/
Modified: 2010-06-21 - 22KB
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- 16:
Semiconductor Research Corporation
- TECHCON 2012 Judging Criteria Criteria Technical Content (0 - 35 points) Perceived Value (0 - 15 points) Technology/Information Transfer (0 - 20 points) Presentation (Paper and ...
URL: https://www.src.org/calendar/e004114/judging-criteria.pdf
Modified: 2012-05-10 - 13KB
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- 17:
TECHCON 2010 for Faculty - SRC
- TECHCON 2010 is a not-to-be-missed event for faculty. Here's why: Faculty who have a student presenting also have an exceptional opportunity to discuss their research with industry ...
URL: https://www.src.org/calendar/e003428/faculty/
Modified: 2010-08-04 - 20KB
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- 18:
Production Test Technique for RF Circuits Using Embedded Test...
- Production Test Technique for RF Circuits Using Embedded Test Sensors Application Type: Utility Patent Number: 7554335 Country: United States Status: Filed on 18-May-2006, Issued ...
URL: https://www.src.org/library/patent/p0595/
Modified: 2009-06-30 - 21KB
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- 19:
2010 SACC and TAB Chair Recognition - SRC
- 2010 SACC and TAB Chair Recognition Steve Hillenius (l), SRC GRC Executive Director, presented the 2010 SACC and TAB Chair Awards to 19 industry representatives including Darvin ...
URL: https://www.src.org/calendar/e003428/tab-chair-awards/
Modified: 2010-09-28 - 22KB
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- 20:
Measuring Bit Error Rate of Radio Frequency Transceivers (Patent...
- Measuring Bit Error Rate of Radio Frequency Transceivers Application Type: Utility Patent Number: 7251574 Country: United States Status: Filed on 24-Mar-2006, Issued on ...
URL: https://www.src.org/library/patent/p0594/
Modified: 2007-07-31 - 21KB
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- 21:
Self-Calibration Systems and Methods (Patent P0596) - SRC
- Self-Calibration Systems and Methods Application Type: Utility Patent Number: 7756663 Country: United States Status: Filed on 27-Jun-2006, Issued on 13-Jul-2010, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0596/
Modified: 2010-07-13 - 21KB
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- 22:
Accuracy Configurable Adders and Methods (Patent P1359) - SRC
- Accuracy Configurable Adders and Methods Application Type: Utility Patent Number: 9229686 Country: United States Status: Filed on 27-Aug-2012, Issued on 5-Jan-2016 Organization: ...
URL: https://www.src.org/library/patent/p1359/
Modified: 2016-01-05 - 24KB
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- 23:
On-Chip Radio Frequency (RF) Interconnects for Network-On-Chip...
- On-Chip Radio Frequency (RF) Interconnects for Network-On-Chip Designs Application Type: Utility Patent Number: 8270316 Country: United States Status: Filed on 30-Jan-2009, Issued ...
URL: https://www.src.org/library/patent/p1123/
Modified: 2012-09-18 - 23KB
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- 24:
ADAPTIVE POWER AMPLIFIER AND METHODS OF MAKING SAME (Patent P1412...
- ADAPTIVE POWER AMPLIFIER AND METHODS OF MAKING SAME Application Type: Utility Patent Number: 9024691 Country: United States Status: Filed on 17-May-2013, Issued on 5-May-2015 ...
URL: https://www.src.org/library/patent/p1412/
Modified: 2015-05-05 - 22KB
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- 25:
Amplifier Having Orthogonal Tuning Elements (Patent P1394) -...
- Amplifier Having Orthogonal Tuning Elements Application Type: Utility Patent Number: 9548705 Country: United States Status: Filed on 14-Mar-2013, Issued on 17-Jan-2017 ...
URL: https://www.src.org/library/patent/p1394/
Modified: 2017-01-17 - 23KB
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- 26:
Methods and Systems for Evaluating the Length of Elongated Elements...
- Methods and Systems for Evaluating the Length of Elongated Elements Application Type: Utility Patent Number: 7835870 Country: United States Status: Filed on 1-Nov-2005, Issued on ...
URL: https://www.src.org/library/patent/p0593/
Modified: 2010-11-16 - 21KB
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- 27:
Methodology For Designing Environment Adaptive Ultra Low Power...
- Methodology For Designing Environment Adaptive Ultra Low Power Wireless Communication Systems & Methods Application Type: Utility Patent Number: 8059571 Country: United States ...
URL: https://www.src.org/library/patent/p1041/
Modified: 2011-11-15 - 21KB
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- 28:
Systems and Methods for Providing Defect-Tolerant Logic Devices...
- Systems and Methods for Providing Defect-Tolerant Logic Devices Application Type: Utility Patent Number: 7696774 Country: United States Status: Filed on 20-May-2008, Issued on ...
URL: https://www.src.org/library/patent/p1075/
Modified: 2010-04-13 - 21KB
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- 29:
Systems and Methods for Measuring I-Q Mismatch (Patent P1246...
- Systems and Methods for Measuring I-Q Mismatch Application Type: Utility Patent Number: 8526533 Country: United States Status: Filed on 24-May-2011, Issued on 3-Sep-2013 ...
URL: https://www.src.org/library/patent/p1246/
Modified: 2013-09-03 - 23KB
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- 30:
Systems and Methods for Distortion Measurement using
Distortion...
- Systems and Methods for Distortion Measurement using Distortion-to-Amplitude Transformations Application Type: Utility Patent Number: 8358169 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1637/
Modified: 2013-01-22 - 23KB
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