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- 1:
TECHCON 2010 Evaluation Summary - SRC
- TECHCON 2010 Evaluation Summary Overall, 134 TECHCON attendees returned evaluations; breakdown by question is: The papers/posters presented indicate research of value to the ...
URL: https://www.src.org/calendar/e003428/evaluation/
Modified: 2010-09-30 - 26KB Find Similar Documents
- 2:
TECHCON 2010 Preview - SRC
- TECHCON 2010 Preview TECHCON is the primary event where SRC presents the best of research sponsored by the membership and showcases the students who perform the research. It is ...
URL: https://www.src.org/calendar/e003428/preview/
Modified: 2010-07-28 - 24KB Find Similar Documents
- 3:
TechFair at TECHCON 2010 - SRC
- TechFair at TECHCON 2010 Over the two days of TECHCON 2010, TechFair will provide the forum for networking and synergy between industry and university researchers, and between ...
URL: https://www.src.org/calendar/e003428/techfair/
Modified: 2010-08-04 - 21KB Find Similar Documents
- 4:
TECHCON 2011 (Event E004113) - SRC
- TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB Find Similar Documents
- 5:
Semiconductor Research Corporation - SRC
- FCRP FCRP Focus Center Research Program (Legacy) Multi-Scale Systems Research Center Creation of a comprehensive and a systematic solution to the distributed multi-scale system ...
URL: https://www.src.org/program/fcrp/
Modified: 2023-10-10 - 32KB Find Similar Documents
- 6:
Slide 1
- Renaissance Hotel Austin, TX September 12-13, 2011 . student presentations . broad research spectrum . networking global research collaboration, focus center research program and ...
URL: https://www.src.org/calendar/e004113/flyer.pdf
Modified: 2010-12-15 - 169KB Find Similar Documents
- 7:
Description
- Call for Abstracts Call for abstracts opens Monday, January 16, 2012. Deadline for submission is 3:00 p.m. eastern time on Wednesday, February 22, 2012. Description TECHCON is ...
URL: https://www.src.org/calendar/e004114/call-for-abstracts.pdf
Modified: 2012-01-26 - 27KB Find Similar Documents
- 8:
Fellowships and Scholarships
- Renaissance Hotel Austin, TX September 13-14, 2010 Showcasing . The quality of the research portfolio . The excellence of SRC students and faculty . The magnitude of the ...
URL: https://www.src.org/calendar/e003428/poster.pdf
Modified: 2010-06-21 - 207KB Find Similar Documents
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TECHCON 2010 Best in Session Awards - SRC
- TECHCON 2010 Best in Session Awards Seventeen students received Best in Session Awards at TECHCON 2010, presented by Dr. Michael Mayberry, Intel, SRC Board of Directors Member ...
URL: https://www.src.org/calendar/e003428/best-in-session/
Modified: 2010-09-29 - 26KB Find Similar Documents
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2010 SACC and TAB Chair Recognition - SRC
- 2010 SACC and TAB Chair Recognition Steve Hillenius (l), SRC GRC Executive Director, presented the 2010 SACC and TAB Chair Awards to 19 industry representatives including Darvin ...
URL: https://www.src.org/calendar/e003428/tab-chair-awards/
Modified: 2010-09-28 - 22KB Find Similar Documents
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Accuracy Configurable Adders and Methods (Patent P1359) - SRC
- Accuracy Configurable Adders and Methods Application Type: Utility Patent Number: 9229686 Country: United States Status: Filed on 27-Aug-2012, Issued on 5-Jan-2016 Organization: ...
URL: https://www.src.org/library/patent/p1359/
Modified: 2016-01-05 - 24KB Find Similar Documents
- 12:
On-Chip Radio Frequency (RF) Interconnects for Network-On-Chip...
- On-Chip Radio Frequency (RF) Interconnects for Network-On-Chip Designs Application Type: Utility Patent Number: 8270316 Country: United States Status: Filed on 30-Jan-2009, Issued ...
URL: https://www.src.org/library/patent/p1123/
Modified: 2012-09-18 - 23KB Find Similar Documents
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TECHCON 2012 (Event E004114) - SRC
- TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB Find Similar Documents
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TECHCON 2010: A Tradition of High Quality - SRC
- TECHCON 2010: Technology and Talent for the 21st Century A Tradition of High Quality Since its inception in 1990, the quality of presentations at TECHCON Conferences has gotten ...
URL: https://www.src.org/calendar/e003428/tradition/
Modified: 2010-06-21 - 21KB Find Similar Documents
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2011 GRC SACC and TAB Chair Recognition - SRC
- 2011 GRC SACC and TAB Chair Recognition Technical Advisory Boards (TABs) and Science Area Coordinating Committees (SACCs) work together with the SRC technical staff to guide the ...
URL: https://www.src.org/calendar/e004113/tab-chair/
Modified: 2011-09-16 - 20KB Find Similar Documents
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TECHCON 2010 for Faculty - SRC
- TECHCON 2010 is a not-to-be-missed event for faculty. Here's why: Faculty who have a student presenting also have an exceptional opportunity to discuss their research with industry ...
URL: https://www.src.org/calendar/e003428/faculty/
Modified: 2010-08-04 - 20KB Find Similar Documents
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Apparatus and Methods for Determining Memory Device Faults (Patent...
- Apparatus and Methods for Determining Memory Device Faults Application Type: Utility Patent Number: 7548473 Country: United States Status: Filed on 14-Apr-2006, Issued on ...
URL: https://www.src.org/library/patent/p0592/
Modified: 2009-06-16 - 21KB Find Similar Documents
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Carbon-based Electronics Workshop (Event E004815) - SRC
- Carbon-based Electronics Workshop Date: Thursday, Sept. 20, 2012, 5 p.m. - Friday, Sept. 21, 2012, 4 p.m. ET Location: Massachusetts Institute of Technology, Building E15, ...
URL: https://www.src.org/calendar/e004815/
Modified: 2013-03-21 - 25KB Find Similar Documents
- 19:
Production Test Technique for RF Circuits Using Embedded Test...
- Production Test Technique for RF Circuits Using Embedded Test Sensors Application Type: Utility Patent Number: 7554335 Country: United States Status: Filed on 18-May-2006, Issued ...
URL: https://www.src.org/library/patent/p0595/
Modified: 2009-06-30 - 21KB Find Similar Documents
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ADAPTIVE POWER AMPLIFIER AND METHODS OF MAKING SAME (Patent P1412...
- ADAPTIVE POWER AMPLIFIER AND METHODS OF MAKING SAME Application Type: Utility Patent Number: 9024691 Country: United States Status: Filed on 17-May-2013, Issued on 5-May-2015 ...
URL: https://www.src.org/library/patent/p1412/
Modified: 2015-05-05 - 22KB Find Similar Documents
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Self-Calibration Systems and Methods (Patent P0596) - SRC
- Self-Calibration Systems and Methods Application Type: Utility Patent Number: 7756663 Country: United States Status: Filed on 27-Jun-2006, Issued on 13-Jul-2010, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0596/
Modified: 2010-07-13 - 21KB Find Similar Documents
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Methods and Systems for Evaluating the Length of Elongated Elements...
- Methods and Systems for Evaluating the Length of Elongated Elements Application Type: Utility Patent Number: 7835870 Country: United States Status: Filed on 1-Nov-2005, Issued on ...
URL: https://www.src.org/library/patent/p0593/
Modified: 2010-11-16 - 21KB Find Similar Documents
- 23:
Methodology For Designing Environment Adaptive Ultra Low Power...
- Methodology For Designing Environment Adaptive Ultra Low Power Wireless Communication Systems & Methods Application Type: Utility Patent Number: 8059571 Country: United States ...
URL: https://www.src.org/library/patent/p1041/
Modified: 2011-11-15 - 21KB Find Similar Documents
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Low Power Programmable Image Processor (Patent P1480) - SRC
- Low Power Programmable Image Processor Application Type: Utility Patent Number: 9477999 Country: United States Status: Filed on 22-Sep-2014, Issued on 25-Oct-2016, Patent Abandoned ...
URL: https://www.src.org/library/patent/p1480/
Modified: 2016-10-25 - 24KB Find Similar Documents
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System and Method for Statistical Post-Silicon Validation (Patent...
- System and Method for Statistical Post-Silicon Validation Application Type: Utility Patent Number: 9411007 Country: United States Status: Filed on 29-Oct-2012, Issued on 9-Aug-2016 ...
URL: https://www.src.org/library/patent/p1357/
Modified: 2016-08-09 - 22KB Find Similar Documents
- 26:
Measuring Bit Error Rate of Radio Frequency Transceivers (Patent...
- Measuring Bit Error Rate of Radio Frequency Transceivers Application Type: Utility Patent Number: 7251574 Country: United States Status: Filed on 24-Mar-2006, Issued on ...
URL: https://www.src.org/library/patent/p0594/
Modified: 2007-07-31 - 21KB Find Similar Documents
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Systems and Methods for Providing Defect-Tolerant Logic Devices...
- Systems and Methods for Providing Defect-Tolerant Logic Devices Application Type: Utility Patent Number: 7696774 Country: United States Status: Filed on 20-May-2008, Issued on ...
URL: https://www.src.org/library/patent/p1075/
Modified: 2010-04-13 - 21KB Find Similar Documents
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Method and Apparatus for Detecting Lithographic Hotspots in a...
- Method and Apparatus for Detecting Lithographic Hotspots in a Circuit Layout Application Type: Utility Patent Number: 7945870 Country: United States Status: Filed on 19-Mar-2007, ...
URL: https://www.src.org/library/patent/p0658/
Modified: 2011-05-17 - 21KB Find Similar Documents
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Systems and Methods for Measuring I-Q Mismatch (Patent P1246...
- Systems and Methods for Measuring I-Q Mismatch Application Type: Utility Patent Number: 8526533 Country: United States Status: Filed on 24-May-2011, Issued on 3-Sep-2013 ...
URL: https://www.src.org/library/patent/p1246/
Modified: 2013-09-03 - 23KB Find Similar Documents
- 30:
Amplifier Having Orthogonal Tuning Elements (Patent P1394) -...
- Amplifier Having Orthogonal Tuning Elements Application Type: Utility Patent Number: 9548705 Country: United States Status: Filed on 14-Mar-2013, Issued on 17-Jan-2017 ...
URL: https://www.src.org/library/patent/p1394/
Modified: 2017-01-17 - 23KB Find Similar Documents
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