[x]
GRC Science Area
CADTS – Computer Aided Design & Test Sciences
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| 1 through 17 of
17 similar documents, best matches first. |
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- 1:
TECHCON 2010 Preview - SRC
- TECHCON 2010 Preview TECHCON is the primary event where SRC presents the best of research sponsored by the membership and showcases the students who perform the research. It is ...
URL: https://www.src.org/calendar/e003428/preview/
Modified: 2010-07-28 - 24KB
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- 2:
 E003932 - Variability Forum - Opening20100430
- The 1st International Variability Characterization Workshop 2 Organizing Committee Yao-Wen Chang National Taiwan University Costas J. Spanos Univ. of California, Berkeley William ...
URL: https://www.src.org/calendar/e003932/e003932_s0_opening.pdf
Modified: 2010-06-29 - 597KB
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- 3:
2010 Inventor Recognition Award Winners - SRC
- Inventor Recognition Awards Presented at TECHCON 2010 [Note: The following is the presentation of the 2009 Inventor Recognition Awards by Elizabeth Weitzman, SRC Executive Vice ...
URL: https://www.src.org/calendar/e003428/inventor/
Modified: 2010-09-29 - 21KB
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- 4:
TECHCON 2010 Best in Session Awards - SRC
- TECHCON 2010 Best in Session Awards Seventeen students received Best in Session Awards at TECHCON 2010, presented by Dr. Michael Mayberry, Intel, SRC Board of Directors Member ...
URL: https://www.src.org/calendar/e003428/best-in-session/
Modified: 2010-09-29 - 26KB
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- 5:
E003932 - Variability Forum - Gupta
- NanoCAD Lab Modeling Performance Impact of Variability Puneet Gupta Dept. of EE, University of California Los Angeles (puneet@ee.ucla.edu) Work partly supported by NSF, UC ...
URL: https://www.src.org/calendar/e003932/e003932_s2_2_gupta.pdf
Modified: 2010-06-29 - 1.4MB
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- 6:
Slide 1
- Renaissance Hotel Austin, TX September 12-13, 2011 . student presentations . broad research spectrum . networking global research collaboration, focus center research program and ...
URL: https://www.src.org/calendar/e004113/flyer.pdf
Modified: 2010-12-15 - 169KB
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- 7:
TECHCON 2010 Evaluation Summary - SRC
- TECHCON 2010 Evaluation Summary Overall, 134 TECHCON attendees returned evaluations; breakdown by question is: The papers/posters presented indicate research of value to the ...
URL: https://www.src.org/calendar/e003428/evaluation/
Modified: 2010-09-30 - 26KB
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- 8:
Fellowships and Scholarships
- Renaissance Hotel Austin, TX September 13-14, 2010 Showcasing . The quality of the research portfolio . The excellence of SRC students and faculty . The magnitude of the ...
URL: https://www.src.org/calendar/e003428/poster.pdf
Modified: 2010-06-21 - 207KB
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- 9:
TechFair at TECHCON 2010 - SRC
- TechFair at TECHCON 2010 Over the two days of TECHCON 2010, TechFair will provide the forum for networking and synergy between industry and university researchers, and between ...
URL: https://www.src.org/calendar/e003428/techfair/
Modified: 2010-08-04 - 21KB
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- 10:
TECHCON 2010 for Faculty - SRC
- TECHCON 2010 is a not-to-be-missed event for faculty. Here's why: Faculty who have a student presenting also have an exceptional opportunity to discuss their research with industry ...
URL: https://www.src.org/calendar/e003428/faculty/
Modified: 2010-08-04 - 20KB
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- 11:
Vertically Integrated Test/Calibration and Reliability Enhancement...
- Vertically Integrated Test/Calibration and Reliability Test/Calibration and Reliability Enhancement for Systems with RF/Analog Content RF/Analog Content Sule Ozev Sule.ozev@asu.edu ...
URL: https://www.src.org/calendar/e004025/ozev.pdf
Modified: 2010-07-19 - 54KB
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- 12:
TECHCON 2010: Author's Kit - Judging Criteria - SRC
- TECHCON 2010: Technology and Talent for the 21st Century Judging Criteria Criteria Technical Content 0 - 35 points Perceived Value 0 - 15 points Technology / Information Transfer 0 ...
URL: https://www.src.org/calendar/e003428/judging-criteria/
Modified: 2010-06-21 - 24KB
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- 13:
Judging Criteria - TECHCON 2011 Author's Kit - SRC
- TECHCON 2011 Author's Kit Judging Criteria Criteria Technical Content 0 - 35 points Perceived Value 0 - 15 points Technology / Information Transfer 0 - 20 points Presentation ...
URL: https://www.src.org/calendar/e004113/judging-criteria/
Modified: 2010-06-21 - 22KB
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- 14:
Slide 1
- Paper Title Authors (presenter first) University Presenter's e-mail address Theme/Task: xxxx.xxx (choose logo from zip file) Note: You may alter this slide design to match your ...
URL: https://www.src.org/calendar/e003428/sample-slides.pdf
Modified: 2010-06-21 - 43KB
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- 15:
E003932 - Variability Forum - Nowka
- Test Structures for Variability Characterization Kevin Nowka IBM Research - Austin nowka@us.ibm.com IBM Research Worldwide Watson Almaden Zurich Beijing Haifa Austin Tokyo Delhi ...
URL: https://www.src.org/calendar/e003932/e003932_s1_3_nowka.pdf
Modified: 2010-06-29 - 1.4MB
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- 16:
E003932 - Variability Forum - Torres
- Variability, Friend or Foe?: An EDA Foe?: An EDA perspective J. Andres Torres LFD Product Lead Engineer Calibre Design to Silicon Division Calibre Design to Silicon Division April ...
URL: https://www.src.org/calendar/e003932/e003932_s3_2_torres.pdf
Modified: 2010-06-29 - 387KB
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- 17:
2010 SACC and TAB Chair Recognition - SRC
- 2010 SACC and TAB Chair Recognition Steve Hillenius (l), SRC GRC Executive Director, presented the 2010 SACC and TAB Chair Awards to 19 industry representatives including Darvin ...
URL: https://www.src.org/calendar/e003428/tab-chair-awards/
Modified: 2010-09-28 - 22KB
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