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SRC Program
GRC 553
FCRP 174
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JUMP 49
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C-SPIN 40
TxACE 33
C2S2 32
FENA 29
GSRC 25
ACE4S 22
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LEAST 20
C-FAR 17
MSD 16
FAME 14
SWAN 12
CRISP 11
SONIC 9
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WIN 7
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ComSenTer 4
EBSM 4
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Benchmarking 3
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INDEX 3
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CAIST 2
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CD – Circuit Design 59
PAT – Patterning 43
TT – Test & Testability 35
Advanced Devices & Technologies 26
SLD – System Level Design 23
AMS-CSD – Analog/Mixed-Signal Ci... 22
I3T – Innovative and Intelligent... 22
HWS – Hardware Security 21
ISD – Integrated System Design 21
LPD – Logic & Physical Design 19
CADT – Computer-Aided Design and... 17
Factory Systems 17
NMP – Nanomanufacturing Material... 15
Pat(MPS) – Patterning 15
PKG – Packaging 14
BEP – Back End Processes 13
NEM – Nanoengineered Materials 13
ASCENT-T1 – Vertical CMOS 12
CRISP-T1 – Hardware Support for ... 9
ADS – Alternative Device Structu... 8
ASCENT-T2 – Beyond CMOS 8
DCMOS – Digital CMOS Technologie... 8
Back End Processes 7
AMML-T1 – Antiferromagnetic Magn... 6
DesTech – Design Techniques 6
Doping Technologies 6
MT – Memory Technologies 6
PatMat – Patterning Materials 6
CFM&TCM – CFM & Total Chemical M... 5
CONIX-T1 – ARENA Integrator 5
VER – Verification 5
CBRIC-T2 – Neuromorphic Fabrics 4
ESH – Environment Safety and Hea... 4
IMPACT-T1 – Materials for Scaled... 4
Packaging & Interconnect Systems 4
Physical Design 4
TechCAD – Technology CAD 4
ADA-T1 – Deft Development 3
AIHW – Artificial Intelligence H... 3
DEEP3M-T4 – Architectures 3
Lithography 3
MTMP – Metrology Tools Matls & P... 3
Masks 3
Materials 3
Modeling & Simulation 3
SemiSynBio – Semiconductor Synth... 3
CBRIC-T1 – Neuro-inspired Algori... 2
CRISP-T3 – Scaling Applications ... 2
ComSenTer-T1 – Systems and Algor... 2
DesSyn – Design Synthesis 2
LMD – Logic and Memory Devices 2
Multi-level Interconnect 2
NEWLIMITS-T2 – 2D Materials Devi... 2
Processes – Processes 2
AMS – Analog and Mixed-Signal De... 1
ASCENT-T4 – Merged Logic Memory ... 1
AdvTech – Advanced Technology 1
C&S – Controls and Sensing 1
CAPSL-T4 – Architectures and Sys... 1
CM – Compact Modeling 1
ComSenTer-T2 – mm-wave/THz ICs a... 1
ComSenTer-T3 – Application-speci... 1
DEEP3M-T2 – Circuits 1
DV – Design Verification 1
Deposition 1
E2CDA2 – E2CDA 2.0 1
Front End Processes 1
IMPACT-T2 – Materials for Storag... 1
Metrology 1
NEWLIMITS-T1 – Novel Computing a... 1
NEWLIMITS-T3 – Advanced Manufact... 1
NEWLIMITS-T4 – Characterization ... 1
Reliability 1
SMART-T1 – Spin-orbit Torque Mat... 1
Synthesis & Verification 1
GRC Science Area
MPS – Material & Process Science... 119
NIS – Nanostructure & Integratio... 100
ICSS – Integrated Circuit & Syst... 92
CADTS – Computer Aided Design & ... 82
NMS – Nanomanufacturing Sciences 82
LIT – Lithography Sciences 41
DS – Device Sciences 33
IPS – Interconnect & Packaging S... 32
MIC – Microstructure Sciences 32
DES – Design Sciences 30
PID – Process Integration & Devi... 28
MBP – Materials & Bulk Processes... 23
INT – Interconnect Sciences 11
MFGPS – Manufacturing Process Sc... 4
ES-H – Environmental Safety & He... 3
FAC – Factory Sciences 1
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1: Inhibiting Address Transitions in Unselected Memory Banks of...
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URL: https://www.src.org/library/patent/p1168/
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3: Methods of Measuring Real-Time Junction Temperature in Silicon...
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URL: https://www.src.org/library/patent/p1917/
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4: Antiferromagnet Field-Effect Based Logic Circuits Including Spin...
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10: Multi-Interval Line Coding Technique for High Speed Transmissions...
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URL: https://www.src.org/library/patent/p0477/
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11: Decoder for Low-Density Parity-Check Convolutional Codes (Patent...
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URL: https://www.src.org/library/patent/p1062/
Modified: 2011-12-13 - 23KB
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12: Incorporating Gate Control over a Resonant Tunneling Structure...
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URL: https://www.src.org/library/patent/p1098/
Modified: 2011-08-30 - 23KB
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13: Medical Device for Detecting a Ventricular Arrhythmia Event ...
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URL: https://www.src.org/library/patent/p1529/
Modified: 2017-08-01 - 24KB
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14: Back-Side-of-Die, Through-Wafer Guided-Wave Optical Clock Distribution...
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URL: https://www.src.org/library/patent/p0363/
Modified: 2006-03-21 - 21KB
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15: Water-Processable Photoresist Compositions (Patent P0186) - SRC
Water-Processable Photoresist Compositions Application Type: Utility Patent Number: 6399273 Country: United States Status: Filed on 14-Aug-2000, Issued on 4-Jun-2002, Patent ...
URL: https://www.src.org/library/patent/p0186/
Modified: 2002-06-04 - 26KB
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16: Multiple-Thickness Gate Oxide Formed by Oxygen Implantation ...
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URL: https://www.src.org/library/patent/p0259/
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17: Water-Processable Photoresist Compositions (Patent P0272) - SRC
Water-Processable Photoresist Compositions Application Type: Foreign National Patent Number: 2001-517217 Country: Japan Status: Filed on 14-Aug-2000, Issued on 5-Feb-2005 ...
URL: https://www.src.org/library/patent/p0272/
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18: Water-Processable Photoresist Compositions (Patent P0282) - SRC
Water-Processable Photoresist Compositions Application Type: European Patent Office Patent Number: EP1240552 Status: Filed on 14-Aug-2000, Issued on 8-Sep-2005, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0282/
Modified: 2005-09-08 - 26KB
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19: Langmuir Probe System for Radio Frequency Excited Plasma Processing...
Langmuir Probe System for Radio Frequency Excited Plasma Processing System Application Type: Utility Patent Number: 5339039 Country: United States Status: Filed on 29-Sep-1992, ...
URL: https://www.src.org/library/patent/p0130/
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20: Bipolar Transistor by Selective and Lateral Epitaxial Overgrowth...
Bipolar Transistor by Selective and Lateral Epitaxial Overgrowth Application Type: Utility Patent Number: 4829016 Country: United States Status: Filed on 19-Oct-1987, Issued on ...
URL: https://www.src.org/library/patent/p0120/
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21: Conductors Created by Metal Deposition Using Selective Passivation...
Conductors Created by Metal Deposition Using Selective Passivation Layer and Related Methods Application Type: Utility Patent Number: 7534967 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p0447/
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22: Multiple Copper Vias for Integrated Circuit Metallization and...
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23: Nanostructures Including Controllably positioned and Aligned...
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URL: https://www.src.org/library/patent/p0554/
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24: Signal Tracing Using On-Chip Memory For In-System Post-Fabrication...
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URL: https://www.src.org/library/patent/p1495/
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25: Signal Tracing using ON-Chip Memory for In-System Post-Fabrication...
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26: Charge Coupled Device Based on Atomically Layered van der Waals...
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URL: https://www.src.org/library/patent/p1514/
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URL: https://www.src.org/library/patent/p0048/
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URL: https://www.src.org/library/patent/p1191/
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29: Method of Forming Boron Carbo-Nitride Layers for Integrated Circuit...
Method of Forming Boron Carbo-Nitride Layers for Integrated Circuit Devices Application Type: Utility Patent Number: 7144803 Country: United States Status: Filed on 16-Apr-2004, ...
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30: Power Switch Design and Method for Reducing Leakage Power in...
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1 through 30 of 933 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 8 9 10 next >>