Probe Module for Testing Chips with Electrical and Optical Input/Output Interconnects, Methods of Use, and Methods of Fabrication

• Application Type:

  Utility

  Patent Number:

  7348786

  Country:

  United States

  Status:

  Filed on 31-Aug-2005, Issued on 25-Mar-2008, Patent Abandoned

  Organization:

  Georgia Institute of Technology

  SRC Filing ID:

  P0555

Inventors

• James D. Meindl (Georgia Tech)
• Oluwafemi Ogunsola (Georgia Tech)
• Hiren D. Thacker (Georgia Tech)