Viewing 226 - 240 of 553
High/Low Work Function Metal Alloys for Integrated Circuit Electrodes and Methods of Fabricating Same
Shinnam Hong (NC State); Veena Misra (NC State); Huicai Zhong (NC State)Patent Expired
Application Type: Utility
Hot-Carrier Suppressed Sub-Micron MOSFET Device
Christine M. Maziar (UT/Austin); Hyungsoon Shin (UT/Austin); Al F. Tasch (UT/Austin)Patent Expired
Application Type: Utility
Hot-Carrier Suppressed Sub-Micron MOSFET Device
Christine M. Maziar (UT/Austin); Hyungsoon Shin (UT/Austin); Al F. Tasch (UT/Austin)Patent Expired
Application Type: European Patent Office
Integrable MOS and IGBT Devices Having Trench Gate Structure
Gerold W. Neudeck (Purdue)Patent Expired
Application Type: Utility
Integrated Circuit Having Clock-Line Control and Method for Testing Same
Sang-Hyeon Baeg (UT/Austin); William A. Rogers (UT/Austin)Patent Expired
Application Type: Utility
Integrated Circuit Packaging and Cooling
John S. Goodling (Auburn); Richard C. Jaeger (Auburn)Patent Expired
Application Type: Utility
Integrated Logic Circuit Including Impedance Fault Detection
William A. Rogers (UT/Austin); Srihari Shoroff (UT/Austin); Mark D. Sloan (UT/Austin)Patent Expired
Application Type: Utility
Ionic Modification of Organic Resins and Photoresists to Produce Photoactive Etch Resistant Compositions
Steven M. Bobbio (UNC/Charlotte); Thomas D. DuBois (UNC/Charlotte); Farid M. Tranjan (UNC/Charlotte)Patent Expired
Application Type: Utility
Langmuir Probe System for Radio Frequency Excited Plasma Processing System
Robert N. Carlile (Univ. of Arizona); Sam Geha (Univ. of Arizona)Patent Expired
Application Type: Utility
Layered and Homogeneous Films of Aluminum and Aluminum/Silicon with Titanium and Tungsten for Multilevel Interconnects
Donald S. Gardner (Stanford); Krishna C. Saraswat (Stanford)Patent Expired
Application Type: Utility
Low Pressure Chemical Vapor Deposition of Reactory Metal Silicides
L. Rafael Reif (MIT); Prabha K. Tedrow (MIT)Patent Expired
Application Type: Utility
Massively Parallel Addressable Array Cathode
Noel C. MacDonald (Cornell)Patent Expired
Application Type: Utility
Measurement of Ultrafine Particle Size Distributions
David Ensor (RTI); Gilmore Sem (TSI Inc.)Patent Expired
Application Type: Utility
Merged Bipolar and Insulated Gate Transistors
Hae-Seung Lee (MIT); Kenneth K. O (MIT); L. Rafael Reif (MIT)Patent Expired
Application Type: Utility
Method and Apparatus for Alignment and Overlay of Submicron Lithographic Features
Steven Brueck (Univ. of New Mexico); Saleem Zaidi (Univ. of New Mexico)Patent Expired
Application Type: Utility